Hiroshi Amemiya

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Nirasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Transporting mechanism, movable probe card transporting apparatus u...
- Patent number 7,385,386
- Issue date Jun 10, 2008
- Tokyo Electron Limited
- Hiroshi Amemiya
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Transporting mechanism, movable probe card transporting apparatus u...
- Patent number 6,958,618
- Issue date Oct 25, 2005
- Tokyo Electron Limited
- Hiroshi Amemiya
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe system
- Patent number 6,762,616
- Issue date Jul 13, 2004
- Tokyo Electron Limited
- Koji Kawaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection methods and apparatuses
- Patent number 6,249,132
- Issue date Jun 19, 2001
- Tokyo Electron Limited
- Hiroshi Amemiya
- G01 - MEASURING TESTING
Information Patent Grant
Low-temperature wafer testing method and prober
- Patent number 6,169,409
- Issue date Jan 2, 2001
- Tokyo Electron Limited
- Hiroshi Amemiya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Transporting mechanism, movable probe card transporting apparatus u...
- Publication number 20050280431
- Publication date Dec 22, 2005
- TOKYO ELECTRON LIMITED
- Hiroshi Amemiya
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Transporting mechanism, movable probe card transporting apparatus u...
- Publication number 20040183525
- Publication date Sep 23, 2004
- Hiroshi Amemiya
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Probe system
- Publication number 20030112002
- Publication date Jun 19, 2003
- Koji Kawaguchi
- G01 - MEASURING TESTING