Hiroshi Amemiya

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Kawagoe, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for measuring electron temperature
- Patent number 5,031,125
- Issue date Jul 9, 1991
- Rikagaku Kenkyusho
- Kazuo Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for detecting contamination on probe surface
- Patent number 4,922,205
- Issue date May 1, 1990
- Rikagaku Kenkyusho
- Kazuo Shimizu
- G01 - MEASURING TESTING