Hiroshi Aoki

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Yokohama-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Profile measuring apparatus, structure manufacturing system, method...
- Patent number 9,891,043
- Issue date Feb 13, 2018
- Nikon Corporation
- Hiroshi Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring three-dimensional objects
- Patent number 9,194,697
- Issue date Nov 24, 2015
- Nikon Corporation
- Hiroshi Aoki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Inspecting apparatus, three-dimensional profile measuring apparatus...
- Patent number 8,514,389
- Issue date Aug 20, 2013
- Nikon Corporation
- Hiroshi Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and measuring method
- Patent number 8,049,901
- Issue date Nov 1, 2011
- Nikon Corporation
- Hiroshi Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Measuring and adjustment device for an alignment optical system and...
- Patent number 7,250,597
- Issue date Jul 31, 2007
- Nikon Corporation
- Hiroshi Aoki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROFILE MEASURING APPARATUS, STRUCTURE MANUFACTURING SYSTEM, METHOD...
- Publication number 20130141734
- Publication date Jun 6, 2013
- Nikon Corporation
- Hiroshi AOKI
- G01 - MEASURING TESTING
Information Patent Application
FORM MEASURING APPARATUS AND FORM MEASURING METHOD
- Publication number 20130076895
- Publication date Mar 28, 2013
- Nikon Corporation
- HIROSHI AOKI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING APPARATUS, THREE-DIMENSIONAL PROFILE MEASURING APPARATUS...
- Publication number 20120236318
- Publication date Sep 20, 2012
- Hiroshi AOKI
- G01 - MEASURING TESTING
Information Patent Application
Measuring device and measuring method
- Publication number 20090237677
- Publication date Sep 24, 2009
- Nikon Corporation
- Hiroshi Aoki
- G01 - MEASURING TESTING
Information Patent Application
Measuring device and adjustment method thereof
- Publication number 20060151679
- Publication date Jul 13, 2006
- Nikon Corporation
- Hiroshi Aoki
- G01 - MEASURING TESTING