Hiroshi ARAI

Person

Kyoto-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning type probe microscope and control device for scanning type...
- Patent number 11,454,647
- Issue date Sep 27, 2022
- Shimadzu Corporation
- Kazuma Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and analysis method
- Patent number 11,415,596
- Issue date Aug 16, 2022
- Shimadzu Corporation
- Hiroshi Arai
- G01 - MEASURING TESTING
Information Patent Grant
Sample container mounting member and sample container sealing method
- Patent number 10,830,791
- Issue date Nov 10, 2020
- Shimadzu Corporation
- Hiroshi Arai
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,697,997
- Issue date Jun 30, 2020
- Shimadzu Corporation
- Hiroshi Arai
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,641,790
- Issue date May 5, 2020
- SHIMADZU CORPORATION
- Kazuma Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and light intensity adjusting method
- Patent number 10,598,691
- Issue date Mar 24, 2020
- SHIMADZU CORPORATION
- Kazuma Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder, fixing member and method for fixing sample
- Patent number 10,354,833
- Issue date Jul 16, 2019
- Shimadzu Corporation
- Hiroshi Arai
- G01 - MEASURING TESTING
Information Patent Grant
Data display processing device, data display processing method and...
- Patent number 10,175,264
- Issue date Jan 8, 2019
- Shimadzu Corporation
- Hiroshi Arai
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE, INFORMATION PROCESSING METHOD, AND PROGRAM
- Publication number 20240418746
- Publication date Dec 19, 2024
- SHIMADZU CORPORATION
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND PROGRAM
- Publication number 20240402215
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSESSMENT METHOD AND SPM
- Publication number 20240069064
- Publication date Feb 29, 2024
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
ANALYZER, DISPLAY CONTROL METHOD, AND RECORDING MEDIUM STORING DISP...
- Publication number 20220358636
- Publication date Nov 10, 2022
- Shimadzu Corporation
- Kazuma WATANABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER
- Publication number 20220357359
- Publication date Nov 10, 2022
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING TYPE PROBE MICROSCOPE AND CONTROL DEVICE FOR SCANNING TYPE...
- Publication number 20210311091
- Publication date Oct 7, 2021
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND ANALYSIS METHOD
- Publication number 20210055326
- Publication date Feb 25, 2021
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE CONTAINER MOUNTING MEMBER AND SAMPLE CONTAINER SEALING METHOD
- Publication number 20190353680
- Publication date Nov 21, 2019
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND LIGHT INTENSITY ADJUSTING METHOD
- Publication number 20190331711
- Publication date Oct 31, 2019
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190324053
- Publication date Oct 24, 2019
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190293680
- Publication date Sep 26, 2019
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER, FIXING MEMBER AND METHOD FOR FIXING SAMPLE
- Publication number 20180330914
- Publication date Nov 15, 2018
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
DATA DISPLAY PROCESSING DEVICE, DATA DISPLAY PROCESSING METHOD AND...
- Publication number 20170322234
- Publication date Nov 9, 2017
- SHIMADZU CORPORATION
- Hiroshi ARAI
- G01 - MEASURING TESTING

Hiroshi ARAI

Person

Patents Grantslast 30 patents

Scanning type probe microscope and control device for scanning type...

Scanning probe microscope and analysis method

Sample container mounting member and sample container sealing method

Scanning probe microscope

Scanning probe microscope

Scanning probe microscope and light intensity adjusting method

Sample holder, fixing member and method for fixing sample

Data display processing device, data display processing method and...

Patents Applicationslast 30 patents

SCANNING PROBE MICROSCOPE, INFORMATION PROCESSING METHOD, AND PROGRAM

SCANNING PROBE MICROSCOPE AND PROGRAM

PROBE ASSESSMENT METHOD AND SPM

ANALYZER, DISPLAY CONTROL METHOD, AND RECORDING MEDIUM STORING DISP...

INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER

SCANNING TYPE PROBE MICROSCOPE AND CONTROL DEVICE FOR SCANNING TYPE...

SCANNING PROBE MICROSCOPE AND ANALYSIS METHOD

SAMPLE CONTAINER MOUNTING MEMBER AND SAMPLE CONTAINER SEALING METHOD

SCANNING PROBE MICROSCOPE AND LIGHT INTENSITY ADJUSTING METHOD

SCANNING PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE

SAMPLE HOLDER, FIXING MEMBER AND METHOD FOR FIXING SAMPLE

DATA DISPLAY PROCESSING DEVICE, DATA DISPLAY PROCESSING METHOD AND...