Hiroshi Ban

Person

Atsugi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe card, method for manufacturing probe card, and prober apparatus
- Patent number 8,305,102
- Issue date Nov 6, 2012
- International Business Machines Corporation
- Yoshikazu Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 6,759,722
- Issue date Jul 6, 2004
- Sharp Kabushiki Kaisha
- Eiji Yanagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device wherein detection of removal of wiring trigger...
- Patent number 6,545,371
- Issue date Apr 8, 2003
- Sharp Kabushiki Kaisha
- Hironori Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 6,472,730
- Issue date Oct 29, 2002
- Sharp Kabushiki Kaisha
- Eiji Yanagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor chip and method of manufacturing the same
- Patent number 6,060,773
- Issue date May 9, 2000
- Nippon Telegraph & Telephone Corporation
- Hiroshi Ban
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Positive resist composition comprising a bis (t-butoxycarbonylmethl...
- Patent number 5,512,417
- Issue date Apr 30, 1996
- Shin-Etsu Chemical Co., Ltd.
- Hiroshi Ban
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Negative working resist material, method for the production of the...
- Patent number 5,457,003
- Issue date Oct 10, 1995
- Nippon Telegraph & Telephone Corporation
- Akinobu Tanaka
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Resist composition comprising a siloxane or silsesquioxane polymer...
- Patent number 5,389,492
- Issue date Feb 14, 1995
- Fuji Photo Film Co., Ltd.
- Tadayoshi Kokubo
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Positive resist material
- Patent number 5,356,753
- Issue date Oct 18, 1994
- Shin-Etsu Chemical Co., Ltd.
- Motoyuki Yamada
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD, METHOD FOR MANUFACTURING PROBE CARD, AND PROBER APPARATUS
- Publication number 20100201390
- Publication date Aug 12, 2010
- International Business Machines Corporation
- Yoshikazu Takahaski
- G01 - MEASURING TESTING
Information Patent Application
semiconductor device and method of manufacturing the same
- Publication number 20010028115
- Publication date Oct 11, 2001
- Eiji Yanagawa
- H01 - BASIC ELECTRIC ELEMENTS

Hiroshi Ban

Person

Patents Grantslast 30 patents

Probe card, method for manufacturing probe card, and prober apparatus

Semiconductor device and method of manufacturing the same

Semiconductor device wherein detection of removal of wiring trigger...

Semiconductor device and method of manufacturing the same

Semiconductor chip and method of manufacturing the same

Positive resist composition comprising a bis (t-butoxycarbonylmethl...

Negative working resist material, method for the production of the...

Resist composition comprising a siloxane or silsesquioxane polymer...

Positive resist material

Patents Applicationslast 30 patents

PROBE CARD, METHOD FOR MANUFACTURING PROBE CARD, AND PROBER APPARATUS

semiconductor device and method of manufacturing the same