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Hiroshi Daimon
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Nara, JP
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Patents Grants
last 30 patents
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Patent Grant
Spherical aberration corrected electrostatic lens, input lens, elec...
Patent number
7,655,923
Issue date
Feb 2, 2010
National University Corporation Nara Institute of Science and Technology
Hiroshi Daimon
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
VARIABLE REDUCTION RATIO SPHERICAL ABERRATION CORRECTION ELECTROSTA...
Publication number
20210193448
Publication date
Jun 24, 2021
National University Corporation Nara Institute of Science and Technology
Hiroyuki MATSUDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Spherical Aberration Corrected Electrostatic Lens, Input Lens, Elec...
Publication number
20080135748
Publication date
Jun 12, 2008
Hiroshi Daimon
G01 - MEASURING TESTING