Hiroshi Daimon

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Spherical electrode type charged particle analyzer
- Patent number 5,107,111
- Issue date Apr 21, 1992
- Shimadzu Corporation
- Hiroshi Daimon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle analyzer
- Patent number 4,849,629
- Issue date Jul 18, 1989
- Shimadzu Corporation
- Hiroshi Daimon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of observing the arrangement of atoms on a surface and appar...
- Patent number 4,724,320
- Issue date Feb 9, 1988
- Shozo Ino
- Shozo Ino
- G01 - MEASURING TESTING