Hiroshi Date

Person

Fukuoka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Fault diagnosis system, fault diagnosis device, fault diagnosis met...
- Patent number 9,496,823
- Issue date Nov 15, 2016
- System JD Co., Ltd.
- Toshiyuki Shigemura
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Conversion device, conversion method, program, and recording medium
- Patent number 8,037,387
- Issue date Oct 11, 2011
- Japan Science and Technology Agency
- Seiji Kajihara
- G01 - MEASURING TESTING
Information Patent Grant
Generating device, generating method, program and recording medium
- Patent number 7,979,765
- Issue date Jul 12, 2011
- Japan Science and Technology Agency
- Xiaoqing Wen
- G11 - INFORMATION STORAGE
Information Patent Grant
Conversion device, conversion method, program, and recording medium
- Patent number 7,971,118
- Issue date Jun 28, 2011
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Generating device, generating method, program and recording medium
- Patent number 7,962,822
- Issue date Jun 14, 2011
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic device, diagnostic method, program, and recording medium
- Patent number 7,913,144
- Issue date Mar 22, 2011
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Grant
Designing of a logic circuit for testability
- Patent number 7,437,340
- Issue date Oct 14, 2008
- Semiconductor Technology Academic Research Center
- Hiroshi Date
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FAULT DIAGNOSIS SYSTEM, FAULT DIAGNOSIS DEVICE, FAULT DIAGNOSIS MET...
- Publication number 20140117999
- Publication date May 1, 2014
- SYSTEM JD CO., LTD.
- Toshiyuki Shigemura
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, PROGRAM, AND RECORDING MEDIUM
- Publication number 20100064191
- Publication date Mar 11, 2010
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
GENERATING DEVICE, GENERATING METHOD, PROGRAM AND RECORDING MEDIUM
- Publication number 20090319842
- Publication date Dec 24, 2009
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
CONVERSION DEVICE, CONVERSION METHOD, PROGRAM, AND RECORDING MEDIUM
- Publication number 20090113261
- Publication date Apr 30, 2009
- Japan Science and Technology Agency
- Seiji Kajihara
- G01 - MEASURING TESTING
Information Patent Application
GENERATING DEVICE, GENERATING METHOD, PROGRAM AND RECORDING MEDIUM
- Publication number 20090019327
- Publication date Jan 15, 2009
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
CONVERSION DEVICE, CONVERSION METHOD, PROGRAM, AND RECORDING MEDIUM
- Publication number 20080235543
- Publication date Sep 25, 2008
- Japan Science and Technology Agency
- Xiaoqing Wen
- G01 - MEASURING TESTING
Information Patent Application
Compacted test plan generation for integrated circuit testing, test...
- Publication number 20030188239
- Publication date Oct 2, 2003
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Application
Designing of logic circuit for testability
- Publication number 20030097347
- Publication date May 22, 2003
- Hiroshi Date
- G01 - MEASURING TESTING

Hiroshi Date

Person

Patents Grantslast 30 patents

Fault diagnosis system, fault diagnosis device, fault diagnosis met...

Conversion device, conversion method, program, and recording medium

Generating device, generating method, program and recording medium

Conversion device, conversion method, program, and recording medium

Generating device, generating method, program and recording medium

Diagnostic device, diagnostic method, program, and recording medium

Designing of a logic circuit for testability

Patents Applicationslast 30 patents

FAULT DIAGNOSIS SYSTEM, FAULT DIAGNOSIS DEVICE, FAULT DIAGNOSIS MET...

DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, PROGRAM, AND RECORDING MEDIUM

GENERATING DEVICE, GENERATING METHOD, PROGRAM AND RECORDING MEDIUM

CONVERSION DEVICE, CONVERSION METHOD, PROGRAM, AND RECORDING MEDIUM

GENERATING DEVICE, GENERATING METHOD, PROGRAM AND RECORDING MEDIUM

CONVERSION DEVICE, CONVERSION METHOD, PROGRAM, AND RECORDING MEDIUM

Compacted test plan generation for integrated circuit testing, test...

Designing of logic circuit for testability