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Hiroshi Fukaya
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Pattern measurement apparatus and pattern measurement method
Patent number
8,605,985
Issue date
Dec 10, 2013
Advantest Corp.
Hiroshi Fukaya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pattern measurement apparatus and pattern measurement method
Patent number
8,507,858
Issue date
Aug 13, 2013
Advantest Corp.
Hiroshi Fukaya
G01 - MEASURING TESTING
Information
Patent Grant
Thick film resistor composition
Patent number
5,567,358
Issue date
Oct 22, 1996
Sumitomo Metal Mining Company Limited
Fujio Makuta
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
PATTERN MEASUREMENT APPARATUS AND PATTERN MEASUREMENT METHOD
Publication number
20130105691
Publication date
May 2, 2013
Advantest Corporation
Hiroshi Fukaya
G01 - MEASURING TESTING
Information
Patent Application
PATTERN MEASUREMENT APPARATUS AND PATTERN MEASUREMENT METHOD
Publication number
20120318976
Publication date
Dec 20, 2012
Jun Matsumoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Pattern measurement apparatus and pattern measurement method
Publication number
20110206271
Publication date
Aug 25, 2011
Hiroshi Fukaya
H01 - BASIC ELECTRIC ELEMENTS