Hiroshi Fukuda

Person

Hino-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
System for estimating the occurrence of defects, and computer-reada...
- Patent number 12,111,272
- Issue date Oct 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical circuit for alignment and optical alignment method
- Patent number 12,066,665
- Issue date Aug 20, 2024
- Nippon Telegraph and Telephone Corporation
- Yoshiho Maeda
- G02 - OPTICS
Information Patent Grant
Aligning optical circuit and aligning method
- Patent number 12,055,773
- Issue date Aug 6, 2024
- Nippon Telegraph and Telephone Corporation
- Toru Miura
- G02 - OPTICS
Information Patent Grant
Inspection device and method
- Patent number 12,044,725
- Issue date Jul 23, 2024
- Nippon Telegraph and Telephone Corporation
- Toru Miura
- G01 - MEASURING TESTING
Information Patent Grant
Authentication device, authentication system, authentication method...
- Patent number 11,941,098
- Issue date Mar 26, 2024
- NEC Corporation
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mount, authentication device, authentication method, and program
- Patent number 11,903,674
- Issue date Feb 20, 2024
- NEC Corporation
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical circuit for alignment
- Patent number 11,880,070
- Issue date Jan 23, 2024
- Nippon Telegraph and Telephone Corporation
- Toru Miura
- G02 - OPTICS
Information Patent Grant
Optical test circuit
- Patent number 11,815,422
- Issue date Nov 14, 2023
- Nippon Telegraph and Telephone Corporation
- Hiroshi Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measurement device and computer program
- Patent number 11,802,763
- Issue date Oct 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- G01 - MEASURING TESTING
Information Patent Grant
System for estimating the occurrence of defects, and computer-reada...
- Patent number 11,747,291
- Issue date Sep 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- G01 - MEASURING TESTING
Information Patent Grant
Mount, authentication device, authentication method, and program
- Patent number 11,601,424
- Issue date Mar 7, 2023
- NEC Corporation
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging method and imaging system
- Patent number 11,532,454
- Issue date Dec 20, 2022
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Authentication device, authentication system, authentication method...
- Patent number 11,487,855
- Issue date Nov 1, 2022
- NEC Corporation
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical circuit for alignment
- Patent number 11,442,229
- Issue date Sep 13, 2022
- Nippon Telegraph and Telephone Corporation
- Toru Miura
- G02 - OPTICS
Information Patent Grant
Pattern measurement device, and computer program
- Patent number 11,424,098
- Issue date Aug 23, 2022
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical inspection circuit
- Patent number 11,415,752
- Issue date Aug 16, 2022
- Nippon Telegraph and Telephone Corporation
- Hiroshi Fukuda
- G02 - OPTICS
Information Patent Grant
Optical circuit for alignment and optical alignment method
- Patent number 11,340,401
- Issue date May 24, 2022
- Nippon Telegraph and Telephone Corporation
- Yoshiho Maeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mount, authentication device, authentication method, and program
- Patent number 11,032,276
- Issue date Jun 8, 2021
- NEC Corporation
- Hiroshi Fukuda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Photodetector
- Patent number 10,720,543
- Issue date Jul 21, 2020
- Nippon Telegraph and Telephone Corporation
- Hiroshi Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measuring method, pattern measuring apparatus, and computer...
- Patent number 10,663,416
- Issue date May 26, 2020
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical module
- Patent number 10,649,147
- Issue date May 12, 2020
- NTT Electronics Corporation
- Tomohiro Nakanishi
- G02 - OPTICS
Information Patent Grant
Optical receiver
- Patent number 10,601,522
- Issue date Mar 24, 2020
- Nippon Telegraph and Telephone Corporation
- Toshihiro Itoh
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Mount, authentication device, authentication method, and program
- Patent number 10,567,378
- Issue date Feb 18, 2020
- NEC Corporation
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image display system, method for controlling image display system,...
- Patent number 10,558,048
- Issue date Feb 11, 2020
- MELEAP INC.
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Authentication device, authentication system, authentication method...
- Patent number 10,528,715
- Issue date Jan 7, 2020
- NEC Corporation
- Hiroshi Fukuda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Authentication device, authentication system, authentication method...
- Patent number 10,496,807
- Issue date Dec 3, 2019
- NEC Corporation
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for defect inspection, sorting, and manufacturing photomask...
- Patent number 10,295,477
- Issue date May 21, 2019
- Shin-Etsu Chemical Co., Ltd.
- Tsuneo Terasawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Coherent optical mixer circuit
- Patent number 10,295,744
- Issue date May 21, 2019
- Nippon Telegraph and Telephone Corporation
- Shin Kamei
- G02 - OPTICS
Information Patent Grant
Optical module
- Patent number 10,277,271
- Issue date Apr 30, 2019
- Nippon Telegraph and Telephone Corporation
- Kiyofumi Kikuchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Polarization multiplexing optical transmission circuit and polariza...
- Patent number 10,193,653
- Issue date Jan 29, 2019
- Nippon Telegraph and Telephone Corporation
- Shin Kamei
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
System for Detecting Defect and Computer-Readable Medium
- Publication number 20240193760
- Publication date Jun 13, 2024
- Hitachi High-Tech Corporation
- Hiroshi FUKUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Circuit, Device and Method for Optical Characteristic Inspection
- Publication number 20240118167
- Publication date Apr 11, 2024
- Nippon Telegraph and Telephone Corporation
- Yoshiho Maeda
- G02 - OPTICS
Information Patent Application
SYSTEM FOR ESTIMATING THE OCCURRENCE OF DEFECTS, AND COMPUTER-READA...
- Publication number 20230333033
- Publication date Oct 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Hiroshi FUKUDA
- G01 - MEASURING TESTING
Information Patent Application
MOUNT, AUTHENTICATION DEVICE, AUTHENTICATION METHOD, AND PROGRAM
- Publication number 20230190107
- Publication date Jun 22, 2023
- NEC CORPORATION
- Hiroshi FUKUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTHENTICATION DEVICE, AUTHENTICATION SYSTEM, AUTHENTICATION METHOD...
- Publication number 20230023622
- Publication date Jan 26, 2023
- NEC Corporation
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measurement Method, Measurement System, and Non-Transitory Computer...
- Publication number 20230019371
- Publication date Jan 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Hiroshi FUKUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optical Phase Modulator
- Publication number 20230010874
- Publication date Jan 12, 2023
- Nippon Telegraph and Telephone Corporation
- Tatsuro Hiraki
- G02 - OPTICS
Information Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND P...
- Publication number 20220410009
- Publication date Dec 29, 2022
- MELEAP INC.
- Hiroshi FUKUDA
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Application
Optical Receiving Device and Manufacturing Method Therefor
- Publication number 20220416108
- Publication date Dec 29, 2022
- Nippon Telegraph and Telephone Corporation
- Yoshiho Maeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optical Circuit Wafer
- Publication number 20220357532
- Publication date Nov 10, 2022
- Nippon Telegraph and Telephone Corporation
- Yoshiho Maeda
- G02 - OPTICS
Information Patent Application
Inspection Device and Method
- Publication number 20220349936
- Publication date Nov 3, 2022
- Nippon Telegraph and Telephone Corporation
- Toru Miura
- G01 - MEASURING TESTING
Information Patent Application
Probe for Optical Circuit Inspection
- Publication number 20220326113
- Publication date Oct 13, 2022
- Nippon Telegraph and Telephone Corporation
- Toru Miura
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Application
Optical Inspection Circuit and Optical Inspection Method
- Publication number 20220229317
- Publication date Jul 21, 2022
- Nippon Telegraph and Telephone Corporation
- Hiroshi Fukuda
- G01 - MEASURING TESTING
Information Patent Application
Optical Circuit for Alignment and Optical Alignment Method
- Publication number 20220171134
- Publication date Jun 2, 2022
- Nippon Telegraph and Telephone Corporation
- Yoshiho Maeda
- G02 - OPTICS
Information Patent Application
ALIGNING OPTICAL CIRCUIT AND ALIGNING METHOD
- Publication number 20220057584
- Publication date Feb 24, 2022
- Nippon Telegraph and Telephone Corporation
- Toru Miura
- G02 - OPTICS
Information Patent Application
Optical Test Circuit
- Publication number 20220042877
- Publication date Feb 10, 2022
- Nippon Telegraph and Telephone Corporation
- Hiroshi Fukuda
- G01 - MEASURING TESTING
Information Patent Application
System for Estimating the Occurrence of Defects, and Computer-Reada...
- Publication number 20210396692
- Publication date Dec 23, 2021
- Hitachi High-Tech Corporation
- Hiroshi FUKUDA
- G01 - MEASURING TESTING
Information Patent Application
Imaging Method and Imaging System
- Publication number 20210350999
- Publication date Nov 11, 2021
- Hitachi High-Tech Corporation
- Hiroshi FUKUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOUNT, AUTHENTICATION DEVICE, AUTHENTICATION METHOD, AND PROGRAM
- Publication number 20210250348
- Publication date Aug 12, 2021
- NEC Corporation
- Hiroshi FUKUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL CIRCUIT FOR ALIGNMENT
- Publication number 20210231878
- Publication date Jul 29, 2021
- Nippon Telegraph and Telephone Corporation
- Toru Miura
- G02 - OPTICS
Information Patent Application
Optical Circuit for Alignment and Optical Alignment Method
- Publication number 20210208339
- Publication date Jul 8, 2021
- Nippon Telegraph and Telephone Corporation
- Yoshiho Maeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optical Circuit for Alignment
- Publication number 20210181425
- Publication date Jun 17, 2021
- Nippon Telegraph and Telephone Corporation
- Toru Miura
- G02 - OPTICS
Information Patent Application
Optical Inspection Circuit
- Publication number 20210181426
- Publication date Jun 17, 2021
- Nippon Telegraph and Telephone Corporation
- Hiroshi Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOUNT, AUTHENTICATION DEVICE, AUTHENTICATION METHOD, AND PROGRAM
- Publication number 20200099681
- Publication date Mar 26, 2020
- NEC Corporation
- Hiroshi FUKUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Measurement Device, and Computer Program
- Publication number 20190371568
- Publication date Dec 5, 2019
- Hitachi High-Technologies Corporation
- Hiroshi FUKUDA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MODULE
- Publication number 20190353844
- Publication date Nov 21, 2019
- NTT ELECTRONICS CORPORATION
- Tomohiro Nakanishi
- G02 - OPTICS
Information Patent Application
AUTHENTICATION DEVICE, AUTHENTICATION SYSTEM, AUTHENTICATION METHOD...
- Publication number 20190188367
- Publication date Jun 20, 2019
- NEC Corporation
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Measurement Device and Computer Program
- Publication number 20190186910
- Publication date Jun 20, 2019
- Hitachi High-Technologies Corporation
- Hiroshi FUKUDA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL RECEIVER
- Publication number 20190181961
- Publication date Jun 13, 2019
- Nippon Telegraph and Telephone Corporation
- Toshihiro Itoh
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Pattern Measuring Method, Pattern Measuring Apparatus, and Computer...
- Publication number 20190120777
- Publication date Apr 25, 2019
- Hitachi High-Technologies Corporation
- Hiroshi FUKUDA
- G01 - MEASURING TESTING

Hiroshi Fukuda

Person

Patents Grantslast 30 patents

System for estimating the occurrence of defects, and computer-reada...

Optical circuit for alignment and optical alignment method

Aligning optical circuit and aligning method

Inspection device and method

Authentication device, authentication system, authentication method...

Mount, authentication device, authentication method, and program

Optical circuit for alignment

Optical test circuit

Pattern measurement device and computer program

System for estimating the occurrence of defects, and computer-reada...

Mount, authentication device, authentication method, and program

Imaging method and imaging system

Authentication device, authentication system, authentication method...

Optical circuit for alignment

Pattern measurement device, and computer program

Optical inspection circuit

Optical circuit for alignment and optical alignment method

Mount, authentication device, authentication method, and program

Photodetector

Pattern measuring method, pattern measuring apparatus, and computer...

Optical module

Optical receiver

Mount, authentication device, authentication method, and program

Image display system, method for controlling image display system,...

Authentication device, authentication system, authentication method...

Authentication device, authentication system, authentication method...

Methods for defect inspection, sorting, and manufacturing photomask...

Coherent optical mixer circuit

Optical module

Polarization multiplexing optical transmission circuit and polariza...

Patents Applicationslast 30 patents

System for Detecting Defect and Computer-Readable Medium

Circuit, Device and Method for Optical Characteristic Inspection

SYSTEM FOR ESTIMATING THE OCCURRENCE OF DEFECTS, AND COMPUTER-READA...

MOUNT, AUTHENTICATION DEVICE, AUTHENTICATION METHOD, AND PROGRAM

AUTHENTICATION DEVICE, AUTHENTICATION SYSTEM, AUTHENTICATION METHOD...

Measurement Method, Measurement System, and Non-Transitory Computer...

Optical Phase Modulator

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND P...

Optical Receiving Device and Manufacturing Method Therefor

Optical Circuit Wafer

Inspection Device and Method

Probe for Optical Circuit Inspection

Optical Inspection Circuit and Optical Inspection Method

Optical Circuit for Alignment and Optical Alignment Method

ALIGNING OPTICAL CIRCUIT AND ALIGNING METHOD

Optical Test Circuit

System for Estimating the Occurrence of Defects, and Computer-Reada...

Imaging Method and Imaging System

MOUNT, AUTHENTICATION DEVICE, AUTHENTICATION METHOD, AND PROGRAM

OPTICAL CIRCUIT FOR ALIGNMENT

Optical Circuit for Alignment and Optical Alignment Method

Optical Circuit for Alignment

Optical Inspection Circuit

MOUNT, AUTHENTICATION DEVICE, AUTHENTICATION METHOD, AND PROGRAM

Pattern Measurement Device, and Computer Program

OPTICAL MODULE

AUTHENTICATION DEVICE, AUTHENTICATION SYSTEM, AUTHENTICATION METHOD...

Pattern Measurement Device and Computer Program

OPTICAL RECEIVER

Pattern Measuring Method, Pattern Measuring Apparatus, and Computer...