Hiroshi Haino

Follow

Person

Tsukuba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for shape measurement using interferometer
- Patent number 6,552,807
- Issue date Apr 22, 2003
- Mitutoyo Corporation
- Naoki Mitsutani
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus
- Patent number 6,496,269
- Issue date Dec 17, 2002
- Mitutoyo Corporation
- Naoki Mitsutani
- G01 - MEASURING TESTING
Information Patent Grant
Scanning wide-area surface shape analyzer
- Patent number 6,473,186
- Issue date Oct 29, 2002
- Mitutoyo Corporation
- Kazuhiko Kawasaki
- G01 - MEASURING TESTING
Information Patent Grant
System for compensating spatial errors
- Patent number 5,408,758
- Issue date Apr 25, 1995
- Mitutoyo Corporation
- Takashi Mizutani
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Scanning wide-area surface shape analyzer
- Publication number 20020018216
- Publication date Feb 14, 2002
- Mitutoyo Corporation
- Kazuhiko Kawasaki
- G01 - MEASURING TESTING
Information Patent Application
Shape measuring apparatus
- Publication number 20010035961
- Publication date Nov 1, 2001
- Mitutoyo Corporation
- Naoki Mitsutani
- G01 - MEASURING TESTING