Hiroshi Hirose

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Hitachinaka-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample evaluation/process observation system and method
- Patent number 5,783,830
- Issue date Jul 21, 1998
- Hitachi, Ltd.
- Hiroshi Hirose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for working a specimen
- Patent number 5,770,861
- Issue date Jun 23, 1998
- Hitachi, Ltd.
- Hiroshi Hirose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample position controller in focused ion beam system
- Patent number 5,434,422
- Issue date Jul 18, 1995
- Hitachi, Ltd.
- Hiroshi Iwamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secondary ion mass analyzing apparatus
- Patent number 5,086,227
- Issue date Feb 4, 1992
- Hitachi, Ltd.
- Hiroshi Toita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometric apparatus
- Patent number 4,808,819
- Issue date Feb 28, 1989
- Hitachi, Ltd.
- Hiroshi Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Spectrofluorophotometer with monitor detector for light source
- Patent number 4,779,982
- Issue date Oct 25, 1988
- Hitachi, Ltd.
- Hiroyuki Koshi
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescence spectrophotometer
- Patent number 4,330,207
- Issue date May 18, 1982
- Hitachi, Ltd.
- Taro Nogami
- G01 - MEASURING TESTING
Information Patent Grant
Spectrofluorometer
- Patent number 4,299,486
- Issue date Nov 10, 1981
- Hitachi, Ltd.
- Taro Nogami
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Processing/observing instrument
- Publication number 20020017619
- Publication date Feb 14, 2002
- Hiroshi Hirose
- H01 - BASIC ELECTRIC ELEMENTS