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Hiroshi IIDA

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  • Kyoto-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Sample preprocessor and analysis system
    • Patent number 12,241,819
    • Issue date Mar 4, 2025
    • HORIBA ADVANCED TECHNO, CO., LTD.
    • Yoko Nakai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample analyzing device
    • Patent number 12,123,887
    • Issue date Oct 22, 2024
    • HORIBA ADVANCED TECHNO, CO., LTD.
    • Hideki Nakayama
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

  • Information Patent Application

    SAMPLE PREPROCESSOR AND ANALYSIS SYSTEM
    • Publication number 20210302289
    • Publication date Sep 30, 2021
    • HORIBA ADVANCED TECHNO, CO., LTD.
    • Yoko NAKAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE ANALYZING DEVICE
    • Publication number 20210116470
    • Publication date Apr 22, 2021
    • HORIBA ADVANCED TECHNO, CO., LTD.
    • Hideki Nakayama
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    SCALE
    • Publication number 20080217074
    • Publication date Sep 11, 2008
    • OMRON HEALTHCARE CO., LTD.
    • Shinya KODAKA
    • G01 - MEASURING TESTING