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Hiroshi Ishijima
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Tokyo, JP
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last 30 patents
Information
Patent Grant
Scanning tunneling microscope
Patent number
4,999,495
Issue date
Mar 12, 1991
Seiko Instruments Inc.
Chikara Miyata
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Fluorescent X-ray device
Patent number
4,461,017
Issue date
Jul 17, 1984
Seiko Instruments & Electronics Ltd.
Toshiyuki Koga
G01 - MEASURING TESTING
Information
Patent Grant
Fluorescent X-ray film thickness gauge for very small areas
Patent number
4,442,535
Issue date
Apr 10, 1984
Seiko Instruments & Electronics Ltd.
Hiroshi Ishijima
G01 - MEASURING TESTING
Information
Patent Grant
Method for measurement of distribution of inclusions in a slab by e...
Patent number
4,331,872
Issue date
May 25, 1982
Nippon Steel Corporation
Hiromu Soga
G01 - MEASURING TESTING
Information
Patent Grant
Detecting apparatus for inserts, thickness unevenness or impurities
Patent number
4,165,461
Issue date
Aug 21, 1979
Kabushiki Kaisha Daini Seikosha
Hiroshi Ishijima
G01 - MEASURING TESTING