Hiroshi Iwata

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Otokuni-gun, JP

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Patents Grantslast 30 patents

Information Patent Grant
Vertical probe card
- Patent number 6,853,208
- Issue date Feb 8, 2005
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Probe, manufacture of same, and vertically operative type probe car...
- Patent number 6,300,783
- Issue date Oct 9, 2001
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing a semiconductor integrated circuit
- Patent number 6,294,922
- Issue date Sep 25, 2001
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Method of reforming a tip portion of a probe
- Patent number 6,013,169
- Issue date Jan 11, 2000
- Japan Electronic Materials Corp.
- Masao Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for maintaining the position of a probe in high temperat...
- Patent number 5,670,889
- Issue date Sep 23, 1997
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Vertical probe card
- Publication number 20020041189
- Publication date Apr 11, 2002
- Nihon Denshizairyo Kabushiki Kaisha
- Masao Okubo
- G01 - MEASURING TESTING