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Hiroshi Kaneta
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Kawasaki, JP
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last 30 patents
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Patent Grant
Silicon crystal oxygen evaluation method using fourier transform in...
Patent number
5,066,599
Issue date
Nov 19, 1991
Fujitsu Limited
Hiroshi Kaneta
G01 - MEASURING TESTING
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Patent Grant
Method for measuring lattice defects in semiconductor
Patent number
4,803,884
Issue date
Feb 14, 1989
Fujitsu Limited
Hiroshi Kaneta
G01 - MEASURING TESTING