Hiroshi Kawaguchi

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection equipment and inspection method
- Patent number 9,261,475
- Issue date Feb 16, 2016
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Grant
Device for detecting foreign matter and method for detecting foreig...
- Patent number 9,164,042
- Issue date Oct 20, 2015
- Hitachi High-Technologies Corporation
- Kenji Aiko
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric conversion element, defect inspecting apparatus, and...
- Patent number 8,884,207
- Issue date Nov 11, 2014
- Hitachi High-Technologies Corporation
- Hiroshi Kawaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Inspection system and inspection method
- Patent number 8,285,032
- Issue date Oct 9, 2012
- Hitachi High-Technologies Corporation
- Hiroshi Kawaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus
- Patent number 8,077,306
- Issue date Dec 13, 2011
- Hitachi High-Technologies Corporation
- Hiroshi Kawaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and inspection method
- Patent number 7,697,746
- Issue date Apr 13, 2010
- Hitachi High-Technologies Corporation
- Hiroshi Kawaguchi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR DETECTING FOREIGN MATTER AND METHOD FOR DETECTING FOREIG...
- Publication number 20130320216
- Publication date Dec 5, 2013
- Hitachi High-Technologies Corporation
- Kenji Aiko
- G01 - MEASURING TESTING
Information Patent Application
Inspection Equipment and Inspection Method
- Publication number 20130187667
- Publication date Jul 25, 2013
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- G01 - MEASURING TESTING
Information Patent Application
PHOTOELECTRIC CONVERSION ELEMENT, DEFECT INSPECTING APPARATUS, AND...
- Publication number 20130161490
- Publication date Jun 27, 2013
- Hiroshi Kawaguchi
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20130148113
- Publication date Jun 13, 2013
- Hitachi High-Technologies Corporation
- Mizuki Oku
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20120313650
- Publication date Dec 13, 2012
- Hitachi High-Technologies Corporation
- Hiroshi Kawaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20100158348
- Publication date Jun 24, 2010
- Hitachi High-Technologies Corporation
- Hiroshi Kawaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection system and inspection method
- Publication number 20060083420
- Publication date Apr 20, 2006
- Hitachi High-Technologies Corporation
- Hiroshi Kawaguchi
- G06 - COMPUTING CALCULATING COUNTING

Hiroshi Kawaguchi

Person

Patents Grantslast 30 patents

Inspection equipment and inspection method

Device for detecting foreign matter and method for detecting foreig...

Photoelectric conversion element, defect inspecting apparatus, and...

Inspection system and inspection method

Defect inspection apparatus

Inspection system and inspection method

Patents Applicationslast 30 patents

DEVICE FOR DETECTING FOREIGN MATTER AND METHOD FOR DETECTING FOREIG...

Inspection Equipment and Inspection Method

PHOTOELECTRIC CONVERSION ELEMENT, DEFECT INSPECTING APPARATUS, AND...

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION DEVICE AND INSPECTION METHOD

INSPECTION SYSTEM AND INSPECTION METHOD

Inspection system and inspection method