Hiroshi Makihara

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Automatic focus detection method, automatic focus detection apparat...
- Patent number 6,091,075
- Issue date Jul 18, 2000
- Hitachi, Ltd.
- Yukihiro Shibata
- G02 - OPTICS
Information Patent Grant
Plate thickness measuring method and apparatus
- Patent number 4,564,296
- Issue date Jan 14, 1986
- Hitachi, Ltd.
- Yoshitada Oshida
- G01 - MEASURING TESTING