Hiroshi Makino

Person

Chino, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Driving device and assembling method for driving device
- Patent number 11,719,320
- Issue date Aug 8, 2023
- Seiko Epson Corporation
- Hiroshi Makino
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Motor and robot
- Patent number 11,043,874
- Issue date Jun 22, 2021
- Seiko Epson Corporation
- Yoshiteru Nishimura
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Semiconductor memory device that can stably perform writing and rea...
- Patent number 10,242,733
- Issue date Mar 26, 2019
- Renesas Electronics Corporation
- Koji Nii
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device that can stably perform writing and rea...
- Patent number 9,984,744
- Issue date May 29, 2018
- Renesas Electronics Corporation
- Koji Nii
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device that can stably perform writing and rea...
- Patent number 9,767,893
- Issue date Sep 19, 2017
- Renesas Electronics Corporation
- Koji Nii
- G11 - INFORMATION STORAGE
Information Patent Grant
Charged particle beam device
- Patent number 9,627,171
- Issue date Apr 18, 2017
- Hitachi High-Technologies Corporation
- Hiroshi Makino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device that can stably perform writing and rea...
- Patent number 9,496,028
- Issue date Nov 15, 2016
- Renesas Electronics Corporation
- Koji Nii
- G11 - INFORMATION STORAGE
Information Patent Grant
Scanning electron microscope
- Patent number 9,472,376
- Issue date Oct 18, 2016
- Hitachi High-Technologies Corporation
- Toshiyuki Yokosuka
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory device that can stably perform writing and rea...
- Patent number 9,218,873
- Issue date Dec 22, 2015
- Renesas Electronics Corporation
- Koji Nii
- G11 - INFORMATION STORAGE
Information Patent Grant
Charged particle ray apparatus and pattern measurement method
- Patent number 8,890,068
- Issue date Nov 18, 2014
- Hitachi High-Technologies Corporation
- Yuji Kasai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam microscope
- Patent number 8,841,612
- Issue date Sep 23, 2014
- Hitachi High-Technologies Corporation
- Muneyuki Fukuda
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,648,300
- Issue date Feb 11, 2014
- Hitachi High-Technologies Corporation
- Miki Isawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory device that can stably perform writing and rea...
- Patent number 8,630,142
- Issue date Jan 14, 2014
- Renesas Electronics Corporation
- Koji Nii
- G11 - INFORMATION STORAGE
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,586,920
- Issue date Nov 19, 2013
- Hitachi High-Technologies Corporation
- Natsuki Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Graphical user interface for use with electron beam wafer inspection
- Patent number 8,502,141
- Issue date Aug 6, 2013
- Hitachi High-Technologies Corporation
- Masaki Hasegawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope and method for detecting an image usin...
- Patent number 8,405,025
- Issue date Mar 26, 2013
- Hitachi High-Technologies Corporation
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory device that can stably perform writing and rea...
- Patent number 8,218,390
- Issue date Jul 10, 2012
- Renesas Electronics Corporation
- Koji Nii
- G11 - INFORMATION STORAGE
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,193,493
- Issue date Jun 5, 2012
- Hitachi High-Technologies Corporation
- Sayaka Tanimoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory device that can stably perform writing and rea...
- Patent number 8,009,500
- Issue date Aug 30, 2011
- Renesas Electronics Corportion
- Koji Nii
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for wafer pattern inspection
- Patent number 7,982,188
- Issue date Jul 19, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Shinada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,906,761
- Issue date Mar 15, 2011
- Hitachi High-Technologies Corporation
- Sayaka Tanimoto
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam apparatus
- Patent number 7,880,143
- Issue date Feb 1, 2011
- Hitachi High-Technologies Corporation
- Sayaka Tanimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system and inspection method
- Patent number 7,755,776
- Issue date Jul 13, 2010
- Hitachi High-Technologies Corporation
- Hiroshi Makino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer inspection tool and semiconductor wafer inspect...
- Patent number 7,728,294
- Issue date Jun 1, 2010
- Hitachi High-Technologies Corporation
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Grant
Charge control apparatus and measurement apparatus equipped with th...
- Patent number 7,683,319
- Issue date Mar 23, 2010
- Hitachi High-Technologies Corporation
- Hiroshi Makino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for scanning and measurement by electron beam
- Patent number 7,655,906
- Issue date Feb 2, 2010
- Hitachi High-Technologies Corporation
- Zhaohui Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 7,652,248
- Issue date Jan 26, 2010
- Hitachi High-Technologies Corporation
- Hiroshi Makino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device provided with antenna ratio countermeasure cir...
- Patent number 7,589,566
- Issue date Sep 15, 2009
- Renesas Technology Corp.
- Shigeki Ohbayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for pattern inspection
- Patent number 7,566,871
- Issue date Jul 28, 2009
- Hitachi High-Technologies Corporation
- Masaki Hasegawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern defect inspection method and apparatus thereof
- Patent number 7,547,884
- Issue date Jun 16, 2009
- Hitachi High-Technologies Corporation
- Masaki Hasegawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Driving Device And Assembling Method For Driving Device
- Publication number 20220145976
- Publication date May 12, 2022
- SEIKO EPSON CORPORATION
- Hiroshi Makino
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Motor And Robot
- Publication number 20190149016
- Publication date May 16, 2019
- SEIKO EPSON CORPORATION
- Yoshiteru NISHIMURA
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE THAT CAN STABLY PERFORM WRITING AND REA...
- Publication number 20180247692
- Publication date Aug 30, 2018
- RENESAS ELECTRONICS CORPORATION
- Koji NII
- G11 - INFORMATION STORAGE
Information Patent Application
ROBOT AND MOTOR
- Publication number 20180006518
- Publication date Jan 4, 2018
- SEIKO EPSON CORPORATION
- Satoru MASAI
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE THAT CAN STABLY PERFORM WRITING AND REA...
- Publication number 20170345488
- Publication date Nov 30, 2017
- RENESAS ELECTRONICS CORPORATION
- Koji NII
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE THAT CAN STABLY PERFORM WRITING AND REA...
- Publication number 20170011794
- Publication date Jan 12, 2017
- RENESAS ELECTRONICS CORPORATION
- Koji NII
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE THAT CAN STABLY PERFORM WRITING AND REA...
- Publication number 20160078925
- Publication date Mar 17, 2016
- RENESAS ELECTRONICS CORPORATION
- Koji NII
- G11 - INFORMATION STORAGE
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20150357153
- Publication date Dec 10, 2015
- Hitachi High-Technologies Corporation
- Hiroshi MAKINO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20150008322
- Publication date Jan 8, 2015
- Hitachi High-Technologies Corporation
- Toshiyuki Yokosuka
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE THAT CAN STABLY PERFORM WRITING AND REA...
- Publication number 20140126278
- Publication date May 8, 2014
- RENESAS ELECTRONICS CORPORATION
- Koji NII
- G11 - INFORMATION STORAGE
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20140014836
- Publication date Jan 16, 2014
- Hitachi High-Technologies Corporation
- Miki ISAWA
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Ray Apparatus and Pattern Measurement Method
- Publication number 20140001360
- Publication date Jan 2, 2014
- Hitachi High-Technologies Corporation
- Yuji Kasai
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND LENGTH MEASURING METHOD USING THE...
- Publication number 20130292568
- Publication date Nov 7, 2013
- Daisuke Bizen
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Microscope
- Publication number 20130126733
- Publication date May 23, 2013
- Hitachi High-Technologies Corporation
- Muneyuki Fukuda
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE OBSERVATION METHOD USING ELECTRON BEAMS AND ELECTRON MICROSCOPE
- Publication number 20120292506
- Publication date Nov 22, 2012
- Hitachi High-Technologies Corporation
- Natsuki Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE THAT CAN STABLY PERFORM WRITING AND REA...
- Publication number 20120243302
- Publication date Sep 27, 2012
- RENESAS ELECTRONICS CORPORATION
- Koji NII
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE THAT CAN STABLY PERFORM WRITING AND REA...
- Publication number 20110273952
- Publication date Nov 10, 2011
- RENESAS ELECTRONICS CORPORATION
- Koji NII
- G11 - INFORMATION STORAGE
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20110204228
- Publication date Aug 25, 2011
- Hitachi High-Technologies Corporation
- Natsuki Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20110139985
- Publication date Jun 16, 2011
- Hitachi High-Technologies Corporation
- Sayaka TANIMOTO
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON BEAM APPARATUS
- Publication number 20100133433
- Publication date Jun 3, 2010
- Sayaka TANIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR INSPECTING A SUBSTRATE, A METHOD OF INSPECTING A SUBS...
- Publication number 20090309022
- Publication date Dec 17, 2009
- Hitachi High-Technologies Corporation
- Yasuhiro GUNJI
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for pattern inspection
- Publication number 20090261252
- Publication date Oct 22, 2009
- Hitachi High-Technologies Corporation
- Masaki Hasegawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charge control apparatus and measurement apparatus equipped with th...
- Publication number 20090166557
- Publication date Jul 2, 2009
- Hiroshi Makino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20090141569
- Publication date Jun 4, 2009
- Renesas Technology Corp.
- Koji Nii
- G11 - INFORMATION STORAGE
Information Patent Application
Scanning Electron Microscope And Method For Detecting An Image Usin...
- Publication number 20090039258
- Publication date Feb 12, 2009
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20080230697
- Publication date Sep 25, 2008
- Sayaka TANIMOTO
- G01 - MEASURING TESTING
Information Patent Application
Inspection system and inspection method
- Publication number 20080073533
- Publication date Mar 27, 2008
- Hitachi High-Technologies Corporation
- Hiroshi Makino
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor wafer inspection tool and semiconductor wafer inspect...
- Publication number 20080067381
- Publication date Mar 20, 2008
- Hitachi High-Technologies Corporation
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION AND MEASUREMENT APPARATUS
- Publication number 20080017797
- Publication date Jan 24, 2008
- Zhaohui CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for pattern inspection
- Publication number 20070272857
- Publication date Nov 29, 2007
- Hitachi High-Technologies Corporation
- Masaki Hasegawa
- G06 - COMPUTING CALCULATING COUNTING

Hiroshi Makino

Person

Patents Grantslast 30 patents

Driving device and assembling method for driving device

Motor and robot

Semiconductor memory device that can stably perform writing and rea...

Semiconductor memory device that can stably perform writing and rea...

Semiconductor memory device that can stably perform writing and rea...

Charged particle beam device

Semiconductor memory device that can stably perform writing and rea...

Scanning electron microscope

Semiconductor memory device that can stably perform writing and rea...

Charged particle ray apparatus and pattern measurement method

Charged particle beam microscope

Charged particle beam apparatus

Semiconductor memory device that can stably perform writing and rea...

Charged particle beam apparatus

Graphical user interface for use with electron beam wafer inspection

Scanning electron microscope and method for detecting an image usin...

Semiconductor memory device that can stably perform writing and rea...

Charged particle beam apparatus

Semiconductor memory device that can stably perform writing and rea...

Apparatus and method for wafer pattern inspection

Charged particle beam apparatus

Electron beam apparatus

Inspection system and inspection method

Semiconductor wafer inspection tool and semiconductor wafer inspect...

Charge control apparatus and measurement apparatus equipped with th...

Method and apparatus for scanning and measurement by electron beam

Inspection apparatus and inspection method

Semiconductor device provided with antenna ratio countermeasure cir...

Method and apparatus for pattern inspection

Pattern defect inspection method and apparatus thereof

Patents Applicationslast 30 patents

Driving Device And Assembling Method For Driving Device

Motor And Robot

SEMICONDUCTOR MEMORY DEVICE THAT CAN STABLY PERFORM WRITING AND REA...

ROBOT AND MOTOR

SEMICONDUCTOR MEMORY DEVICE THAT CAN STABLY PERFORM WRITING AND REA...

SEMICONDUCTOR MEMORY DEVICE THAT CAN STABLY PERFORM WRITING AND REA...

SEMICONDUCTOR MEMORY DEVICE THAT CAN STABLY PERFORM WRITING AND REA...

CHARGED PARTICLE BEAM DEVICE

SCANNING ELECTRON MICROSCOPE

SEMICONDUCTOR MEMORY DEVICE THAT CAN STABLY PERFORM WRITING AND REA...

CHARGED PARTICLE BEAM APPARATUS

Charged Particle Ray Apparatus and Pattern Measurement Method

SCANNING ELECTRON MICROSCOPE AND LENGTH MEASURING METHOD USING THE...

Charged Particle Beam Microscope

SAMPLE OBSERVATION METHOD USING ELECTRON BEAMS AND ELECTRON MICROSCOPE

SEMICONDUCTOR MEMORY DEVICE THAT CAN STABLY PERFORM WRITING AND REA...

SEMICONDUCTOR MEMORY DEVICE THAT CAN STABLY PERFORM WRITING AND REA...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

ELECTRON BEAM APPARATUS

APPARATUS FOR INSPECTING A SUBSTRATE, A METHOD OF INSPECTING A SUBS...

Method and apparatus for pattern inspection

Charge control apparatus and measurement apparatus equipped with th...

SEMICONDUCTOR MEMORY DEVICE

Scanning Electron Microscope And Method For Detecting An Image Usin...

CHARGED PARTICLE BEAM APPARATUS

Inspection system and inspection method

Semiconductor wafer inspection tool and semiconductor wafer inspect...

PATTERN INSPECTION AND MEASUREMENT APPARATUS

Method and apparatus for pattern inspection