Hiroshi Marumo

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Kofu, JP

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Patents Grantslast 30 patents

Information Patent Grant
Vertical probe tester card with coaxial probes
- Patent number 5,525,911
- Issue date Jun 11, 1996
- Tokyo Electron Limited
- Hiroshi Marumo
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus
- Patent number 5,461,327
- Issue date Oct 24, 1995
- Tokyo Electron Limited
- Junichiro Shibata
- G01 - MEASURING TESTING