Hiroshi Masusaki

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor manufacturing method and semiconductor manufacturing...
- Patent number 7,033,843
- Issue date Apr 25, 2006
- Taiyo Nippon Sanso Corporation
- Hiroyuki Hasegawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of purging CVD apparatus and method for judging maintenance...
- Patent number 6,887,721
- Issue date May 3, 2005
- Mitsubishi Materials Silicon Corporation
- Hiroyuki Hasegawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Spectroscopic method for analyzing isotopes by using a semiconducto...
- Patent number 6,800,855
- Issue date Oct 5, 2004
- Nippon Sanso Corporation
- Jie Dong
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor manufacturing method and semiconductor manufacturing...
- Patent number 6,794,204
- Issue date Sep 21, 2004
- Mitsubishi Materials Silicon Corporation
- Hiroyuki Hasegawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Semiconductor manufacturing apparatus having a moisture measuring d...
- Patent number 6,776,805
- Issue date Aug 17, 2004
- Mitsubishi Materials Silicon Corporation
- Hiroyuki Hasegawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Spectroscopic method for analyzing a gas by using laser beam
- Patent number 6,636,316
- Issue date Oct 21, 2003
- Nippon Sanso Corporation
- Koh Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
CVD apparatus equipped with moisture monitoring
- Patent number 6,491,758
- Issue date Dec 10, 2002
- Mitsubishi Materials Silicon Corporation
- Hiroyuki Hasegawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Laser spectroscopy system
- Patent number 6,483,589
- Issue date Nov 19, 2002
- Nippon Sanso Corporation
- Katsumasa Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Infrared spectroscopic analysis method for gases and device employi...
- Patent number 5,821,537
- Issue date Oct 13, 1998
- Nippon Sanso Corporation
- Yoshio Ishihara
- G01 - MEASURING TESTING
Information Patent Grant
Infrared spectroscopic analysis method for gases and device employi...
- Patent number 5,703,365
- Issue date Dec 30, 1997
- Nippon Sanso Corporation
- Yoshio Ishihara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor manufacturing method and semiconductor manufacturing...
- Publication number 20040092043
- Publication date May 13, 2004
- Mitsubishi Materials Silicon Corporation
- Hiroyuki Hasegawa
- C30 - CRYSTAL GROWTH
Information Patent Application
Semiconductor manufacturing method and semiconductor manufacturing...
- Publication number 20030022469
- Publication date Jan 30, 2003
- Hiroyuki Hasegawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method of purging CVD apparatus and method for judging maintenance...
- Publication number 20020061605
- Publication date May 23, 2002
- Mitsubishi Materials Silicon Corporation and Nippon Sanso Corporation
- Hiroyuki Hasegawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Semiconductor manufacturing method and semiconductor manufacturing...
- Publication number 20010019900
- Publication date Sep 6, 2001
- Hiroyuki Hasegawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Hiroshi Masusaki

Person

Patents Grantslast 30 patents

Semiconductor manufacturing method and semiconductor manufacturing...

Method of purging CVD apparatus and method for judging maintenance...

Spectroscopic method for analyzing isotopes by using a semiconducto...

Semiconductor manufacturing method and semiconductor manufacturing...

Semiconductor manufacturing apparatus having a moisture measuring d...

Spectroscopic method for analyzing a gas by using laser beam

CVD apparatus equipped with moisture monitoring

Laser spectroscopy system

Infrared spectroscopic analysis method for gases and device employi...

Infrared spectroscopic analysis method for gases and device employi...

Patents Applicationslast 30 patents

Semiconductor manufacturing method and semiconductor manufacturing...

Semiconductor manufacturing method and semiconductor manufacturing...

Method of purging CVD apparatus and method for judging maintenance...

Semiconductor manufacturing method and semiconductor manufacturing...