Hiroshi Matsuoka

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Manufacturing device, manufacturing management system, and manufact...
- Patent number 10,721,848
- Issue date Jul 21, 2020
- Fukuoka University
- Hajime Tomokage
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of evaluating amount of foreign matter passed through recirc...
- Patent number 10,488,317
- Issue date Nov 26, 2019
- Mitsubishi Heavy Industries, Ltd.
- Hideyuki Sakata
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Information administration system
- Patent number 9,769,125
- Issue date Sep 19, 2017
- ZUKEN INC.
- Hajime Tomokage
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor device
- Patent number 7,190,010
- Issue date Mar 13, 2007
- Mitsubishi Denki Kabushiki Kaisha
- Takachika Imato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit board and electronic equipment using the same
- Patent number 6,617,529
- Issue date Sep 9, 2003
- NEC Corporation
- Naomi Ishizuka
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of manufacturing semiconductor device with plated heat sink...
- Patent number 6,589,815
- Issue date Jul 8, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hiroshi Matsuoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing semiconductor device with heat dissipation meta...
- Patent number 6,245,596
- Issue date Jun 12, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Katsuya Kosaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with plated heat sink and partially plated sid...
- Patent number 6,157,077
- Issue date Dec 5, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Hiroshi Matsuoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with heat dissipation metal layer and metal pr...
- Patent number 6,008,537
- Issue date Dec 28, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Katsuya Kosaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including plated heat sink and airbridge for h...
- Patent number 5,864,169
- Issue date Jan 26, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Teruyuki Shimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rotating apparatus
- Patent number 5,749,556
- Issue date May 12, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Hiroshi Matsuoka
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Semiconductor device
- Patent number 5,488,253
- Issue date Jan 30, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Hiroshi Matsuoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a recessed gate field effect transistor
- Patent number 5,338,703
- Issue date Aug 16, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Hiroshi Matsuoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Air bridge wiring for semiconductor devices
- Patent number 4,924,289
- Issue date May 8, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Hiroshi Matsuoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit
- Patent number 4,908,680
- Issue date Mar 13, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Hiroshi Matsuoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Swivel support structure for an electric apparatus
- Patent number 4,796,842
- Issue date Jan 10, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Takashi Hamada
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF EVALUATING AMOUNT OF FOREIGN MATTER PASSED THROUGH RECIRC...
- Publication number 20170176315
- Publication date Jun 22, 2017
- Mitsubishi Heavy Industries, Ltd.
- Hideyuki Sakata
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING DEVICE, MANUFACTURING MANAGEMENT SYSTEM, AND MANUFACT...
- Publication number 20160192551
- Publication date Jun 30, 2016
- FUKUOKA UNIVERSITY
- Hajime TOMOKAGE
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Information Administration System
- Publication number 20150200916
- Publication date Jul 16, 2015
- ZUKEN INC.
- Hajime TOMOKAGE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
REACTOR CONTAINMENT STRUCTURE
- Publication number 20120057668
- Publication date Mar 8, 2012
- Mitsubishi Heavy Industries, Ltd.
- Nobuki Uda
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
REACTOR CONTAINMENT STRUCTURE
- Publication number 20120051487
- Publication date Mar 1, 2012
- Mitsubishi Heavy Industries, Ltd.
- Hideo Fukuda
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
REACTOR CONTAINMENT STRUCTURE
- Publication number 20120051486
- Publication date Mar 1, 2012
- Mitsubishi Heavy Industries, Ltd.
- Nobuki Uda
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
METHOD FOR PRODUCING UNSATURATED ETHER COMPOUND
- Publication number 20090054697
- Publication date Feb 26, 2009
- KYOWA HAKKO CHEMICAL CO., LTD.
- Ryo Numazaki
- C07 - ORGANIC CHEMISTRY
Information Patent Application
PHOTORESIST COMPOSITION
- Publication number 20090035696
- Publication date Feb 5, 2009
- KYOWA HAKKO CHEMICAL CO., LTD.
- Hiroshi Matsuoka
- C07 - ORGANIC CHEMISTRY
Information Patent Application
PROCESS FOR PRODUCING COMPOUND HAVING ACID-LABILE GROUP
- Publication number 20090035702
- Publication date Feb 5, 2009
- KYOWA HAKKO CHEMICAL CO., LTD
- Hiroshi Matsuoka
- C07 - ORGANIC CHEMISTRY
Information Patent Application
Method for producing compound having acid-labile group
- Publication number 20060177763
- Publication date Aug 10, 2006
- KYOWA HAKKO CHEMICAL CO., LTD.
- Hiroshi Matsuoka
- C07 - ORGANIC CHEMISTRY
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20050224846
- Publication date Oct 13, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Takachika Imato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuit board and electronic equipment using the same
- Publication number 20020074164
- Publication date Jun 20, 2002
- NEC Corporation
- Naomi Ishizuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRIC CONTACT DEVICE FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20010040464
- Publication date Nov 15, 2001
- MICHINOBU TANIOKA
- G01 - MEASURING TESTING

Hiroshi Matsuoka

Person

Patents Grantslast 30 patents

Manufacturing device, manufacturing management system, and manufact...

Method of evaluating amount of foreign matter passed through recirc...

Information administration system

Semiconductor device

Circuit board and electronic equipment using the same

Method of manufacturing semiconductor device with plated heat sink...

Method of producing semiconductor device with heat dissipation meta...

Semiconductor device with plated heat sink and partially plated sid...

Semiconductor device with heat dissipation metal layer and metal pr...

Semiconductor device including plated heat sink and airbridge for h...

Rotating apparatus

Semiconductor device

Method for producing a recessed gate field effect transistor

Air bridge wiring for semiconductor devices

Semiconductor integrated circuit

Swivel support structure for an electric apparatus

Patents Applicationslast 30 patents

METHOD OF EVALUATING AMOUNT OF FOREIGN MATTER PASSED THROUGH RECIRC...

MANUFACTURING DEVICE, MANUFACTURING MANAGEMENT SYSTEM, AND MANUFACT...

Information Administration System

REACTOR CONTAINMENT STRUCTURE

REACTOR CONTAINMENT STRUCTURE

REACTOR CONTAINMENT STRUCTURE

METHOD FOR PRODUCING UNSATURATED ETHER COMPOUND

PHOTORESIST COMPOSITION

PROCESS FOR PRODUCING COMPOUND HAVING ACID-LABILE GROUP

Method for producing compound having acid-labile group

Semiconductor device and method of manufacturing the same

Circuit board and electronic equipment using the same

ELECTRIC CONTACT DEVICE FOR TESTING SEMICONDUCTOR DEVICE