Hiroshi Matsushita

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Luminaire and lamp apparatus housing
- Patent number 8,894,254
- Issue date Nov 25, 2014
- Toshiba Lighting & Technology Corporation
- Ryotaro Matsuda
- F21 - LIGHTING
Information Patent Grant
Management method and system for exposure apparatus having alarm ba...
- Patent number 8,836,919
- Issue date Sep 16, 2014
- Kabushiki Kaisha Toshiba
- Kenichi Tsujisawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lamp device and luminaire
- Patent number 8,764,249
- Issue date Jul 1, 2014
- Toshiba Lighting & Technology Corporation
- Masahiro Toda
- F21 - LIGHTING
Information Patent Grant
Failure detecting method, failure detecting apparatus, and semicond...
- Patent number 8,170,707
- Issue date May 1, 2012
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Grant
Linear pattern detection method and apparatus
- Patent number 8,081,814
- Issue date Dec 20, 2011
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for managing semiconductor manufacturing device
- Patent number 7,979,154
- Issue date Jul 12, 2011
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for controlling semiconductor manufacturing apparatus and co...
- Patent number 7,970,486
- Issue date Jun 28, 2011
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Grant
Management system of semiconductor fabrication apparatus, abnormali...
- Patent number 7,742,834
- Issue date Jun 22, 2010
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Semiconductor wafer with ID mark, equipment for and method of manuf...
- Patent number 7,700,381
- Issue date Apr 20, 2010
- Kabushikia Kaisha Toshiba
- Tsunetoshi Arikado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Abnormality cause specifying method, abnormality cause specifying s...
- Patent number 7,599,817
- Issue date Oct 6, 2009
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect detection system, defect detection method, and defect detect...
- Patent number 7,529,631
- Issue date May 5, 2009
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing fail bit maps of waters and apparatus therefor
- Patent number 7,405,088
- Issue date Jul 29, 2008
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Equipment for and method of detecting faults in semiconductor integ...
- Patent number 7,222,026
- Issue date May 22, 2007
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
System and method for monitoring manufacturing apparatuses
- Patent number 7,221,991
- Issue date May 22, 2007
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
System and method for identifying a manufacturing tool causing a fault
- Patent number 7,197,414
- Issue date Mar 27, 2007
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Semiconductor processing device, semiconductor processing system an...
- Patent number 7,162,072
- Issue date Jan 9, 2007
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for analyzing fail bit maps of wafers
- Patent number 7,138,283
- Issue date Nov 21, 2006
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor wafer with ID mark, equipment for and method of manuf...
- Patent number 7,057,259
- Issue date Jun 6, 2006
- Kabushiki Kaisha Toshiba
- Tsunetoshi Arikado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Failure detection system, failure detection method, and computer pr...
- Patent number 7,043,384
- Issue date May 9, 2006
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G11 - INFORMATION STORAGE
Information Patent Grant
Defect-position identifying method for semiconductor substrate
- Patent number 6,320,655
- Issue date Nov 20, 2001
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer and method of manufacturing the same
- Patent number 6,146,911
- Issue date Nov 14, 2000
- Kabushiki Kaisha Toshiba
- Norihiko Tsuchiya
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ABNORMALITY PORTENT DETECTION SYSTEM AND METHOD OF MANUFACTURING SE...
- Publication number 20160293462
- Publication date Oct 6, 2016
- KABUSHIKI KAISHA TOSHIBA
- Hiroshi MATSUSHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Lamp Device and Luminaire
- Publication number 20140169004
- Publication date Jun 19, 2014
- TOSHIBA LIGHTING & TECHNOLOGY CORPORATION
- Hiromichi Nakajima
- F21 - LIGHTING
Information Patent Application
Lamp and Luminaire
- Publication number 20140153250
- Publication date Jun 5, 2014
- Toshiba Lighting & Technology Corporation
- Hiroshi Matsushita
- F21 - LIGHTING
Information Patent Application
Luminaire
- Publication number 20130308294
- Publication date Nov 21, 2013
- Kabushiki Kaisha Toshiba
- Kenji Nezu
- F21 - LIGHTING
Information Patent Application
BULB-SHAPED LAMP AND LIGHTING DEVICE
- Publication number 20130201696
- Publication date Aug 8, 2013
- TOSHIBA LIGHTING & TECHNOLOGY CORPORATION
- Takeshi Hisayasu
- F21 - LIGHTING
Information Patent Application
LED LIGHTING DEVICE AND LED LUMINAIRE
- Publication number 20130083549
- Publication date Apr 4, 2013
- Toshiba Lighting & Technology Corporation
- Yuichiro Takahara
- F21 - LIGHTING
Information Patent Application
Lamp Device
- Publication number 20120313551
- Publication date Dec 13, 2012
- Toshiba Lighting & Technology Corporation
- Hiromichi NAKAJIMA
- F21 - LIGHTING
Information Patent Application
LAMP APPARATUS AND LUMINAIRE
- Publication number 20120262928
- Publication date Oct 18, 2012
- Toshiba Lighting & Technology Corporation
- Ryotaro Matsuda
- F21 - LIGHTING
Information Patent Application
LAMP DEVICE AND LUMINAIRE
- Publication number 20120243237
- Publication date Sep 27, 2012
- Tochiba Lighting & Technology Corporation
- Masahiro TODA
- F21 - LIGHTING
Information Patent Application
DEFECT ANALYSIS METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20120029679
- Publication date Feb 2, 2012
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL METHOD AND CONTROL SYSTEM FOR EXPOSURE APPARATUS
- Publication number 20120028192
- Publication date Feb 2, 2012
- Kabushiki Kaisha Toshiba
- Kenichi TSUJISAWA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and system for managing semiconductor manufacturing device
- Publication number 20110245956
- Publication date Oct 6, 2011
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Application
FAILURE CAUSE IDENTIFYING DEVICE AND METHOD FOR IDENTIFYING FAILURE...
- Publication number 20100060470
- Publication date Mar 11, 2010
- Hiroshi MATSUSHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LINEAR PATTERN DETECTION METHOD AND APPARATUS
- Publication number 20090220142
- Publication date Sep 3, 2009
- Hiroshi MATSUSHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAILURE DETECTING METHOD, FAILURE DETECTING APPARATUS, AND SEMICOND...
- Publication number 20090117673
- Publication date May 7, 2009
- Hiroshi MATSUSHITA
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND SYSTEM FOR MANAGING SEMICONDUCTOR MANUFACTURING DEVICE
- Publication number 20080147226
- Publication date Jun 19, 2008
- Hiroshi MATSUSHITA
- G05 - CONTROLLING REGULATING
Information Patent Application
Defect detection system, defect detection method, and defect detect...
- Publication number 20080004823
- Publication date Jan 3, 2008
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Application
Management system of semiconductor fabrication apparatus, abnormali...
- Publication number 20070276528
- Publication date Nov 29, 2007
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Application
Method for controlling semiconductor manufacturing apparatus and co...
- Publication number 20070225853
- Publication date Sep 27, 2007
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Application
Abnormality cause specifying method, abnormality cause specifying s...
- Publication number 20060281199
- Publication date Dec 14, 2006
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Application
Semiconductor wafer with ID mark, equipment for and method of manuf...
- Publication number 20060131696
- Publication date Jun 22, 2006
- Kabushiki Kaisha Toshiba
- Tsunetoshi Arikado
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for identifying a manufacturing tool causing a fault
- Publication number 20050251365
- Publication date Nov 10, 2005
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Application
System and method for controlling manufacturing apparatuses
- Publication number 20050194590
- Publication date Sep 8, 2005
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Application
Failure detection system, failure detection method, and computer pr...
- Publication number 20050102591
- Publication date May 12, 2005
- Hiroshi Matsushita
- G01 - MEASURING TESTING
Information Patent Application
Method for analyzing fail bit maps of wafers
- Publication number 20050021303
- Publication date Jan 27, 2005
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G11 - INFORMATION STORAGE
Information Patent Application
Method for analyzing fail bit maps of wafers and apparatus therefor
- Publication number 20040255198
- Publication date Dec 16, 2004
- Hiroshi Matsushita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Failure analysis system, failure analysis method, a computer progra...
- Publication number 20040049722
- Publication date Mar 11, 2004
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor processing device, semiconductor processing system an...
- Publication number 20030157736
- Publication date Aug 21, 2003
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Equipment for and method of detecting faults in semiconductor integ...
- Publication number 20030011376
- Publication date Jan 16, 2003
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wafer with ID mark, equipment for and method of manuf...
- Publication number 20030003608
- Publication date Jan 2, 2003
- Tsunetoshi Arikado
- H01 - BASIC ELECTRIC ELEMENTS

Hiroshi Matsushita

Person

Patents Grantslast 30 patents

Luminaire and lamp apparatus housing

Management method and system for exposure apparatus having alarm ba...

Lamp device and luminaire

Failure detecting method, failure detecting apparatus, and semicond...

Linear pattern detection method and apparatus

Method and system for managing semiconductor manufacturing device

Method for controlling semiconductor manufacturing apparatus and co...

Management system of semiconductor fabrication apparatus, abnormali...

Semiconductor wafer with ID mark, equipment for and method of manuf...

Abnormality cause specifying method, abnormality cause specifying s...

Defect detection system, defect detection method, and defect detect...

Method for analyzing fail bit maps of waters and apparatus therefor

Equipment for and method of detecting faults in semiconductor integ...

System and method for monitoring manufacturing apparatuses

System and method for identifying a manufacturing tool causing a fault

Semiconductor processing device, semiconductor processing system an...

Method for analyzing fail bit maps of wafers

Semiconductor wafer with ID mark, equipment for and method of manuf...

Failure detection system, failure detection method, and computer pr...

Defect-position identifying method for semiconductor substrate

Semiconductor wafer and method of manufacturing the same

Patents Applicationslast 30 patents

ABNORMALITY PORTENT DETECTION SYSTEM AND METHOD OF MANUFACTURING SE...

Lamp Device and Luminaire

Lamp and Luminaire

Luminaire

BULB-SHAPED LAMP AND LIGHTING DEVICE

LED LIGHTING DEVICE AND LED LUMINAIRE

Lamp Device

LAMP APPARATUS AND LUMINAIRE

LAMP DEVICE AND LUMINAIRE

DEFECT ANALYSIS METHOD OF SEMICONDUCTOR DEVICE

CONTROL METHOD AND CONTROL SYSTEM FOR EXPOSURE APPARATUS

Method and system for managing semiconductor manufacturing device

FAILURE CAUSE IDENTIFYING DEVICE AND METHOD FOR IDENTIFYING FAILURE...

LINEAR PATTERN DETECTION METHOD AND APPARATUS

FAILURE DETECTING METHOD, FAILURE DETECTING APPARATUS, AND SEMICOND...

METHOD AND SYSTEM FOR MANAGING SEMICONDUCTOR MANUFACTURING DEVICE

Defect detection system, defect detection method, and defect detect...

Management system of semiconductor fabrication apparatus, abnormali...

Method for controlling semiconductor manufacturing apparatus and co...

Abnormality cause specifying method, abnormality cause specifying s...

Semiconductor wafer with ID mark, equipment for and method of manuf...

System and method for identifying a manufacturing tool causing a fault

System and method for controlling manufacturing apparatuses

Failure detection system, failure detection method, and computer pr...

Method for analyzing fail bit maps of wafers

Method for analyzing fail bit maps of wafers and apparatus therefor

Failure analysis system, failure analysis method, a computer progra...

Semiconductor processing device, semiconductor processing system an...

Equipment for and method of detecting faults in semiconductor integ...

Semiconductor wafer with ID mark, equipment for and method of manuf...