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Hiroshi Matsuyama

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  • Kawasaki-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor device
    • Patent number 10,957,673
    • Issue date Mar 23, 2021
    • Kabushiki Kaisha Toshiba
    • Hiroshi Matsuyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Terminal plate and semiconductor device
    • Patent number 10,896,867
    • Issue date Jan 19, 2021
    • Kabushiki Kaisha Toshiba
    • Eitaro Miyake
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor device
    • Patent number 10,855,196
    • Issue date Dec 1, 2020
    • Kabushiki Kaisha Toshiba
    • Eitaro Miyake
    • H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
  • Information Patent Grant

    Semiconductor device
    • Patent number 10,658,344
    • Issue date May 19, 2020
    • Kabushiki Kaisha Toshiba
    • Hiroshi Matsuyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor device
    • Patent number 10,410,985
    • Issue date Sep 10, 2019
    • Kabushiki Kaisha Toshiba
    • Hiroshi Matsuyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor device including semiconductor chips electrically con...
    • Patent number 9,953,902
    • Issue date Apr 24, 2018
    • Kabushiki Kaisha Toshiba
    • Shigeaki Hayase
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor module
    • Patent number 9,881,906
    • Issue date Jan 30, 2018
    • Kabushiki Kaisha Toshiba
    • Hiroshi Matsuyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor package
    • Patent number 9,799,597
    • Issue date Oct 24, 2017
    • Kabushiki Kaisha Toshiba
    • Hiroshi Matsuyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor device
    • Patent number 9,768,100
    • Issue date Sep 19, 2017
    • Kabushiki Kaisha Toshiba
    • Hiroshi Matsuyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Interrupter
    • Patent number 8,008,616
    • Issue date Aug 30, 2011
    • Kabushiki Kaisha Toshiba
    • Hiroshi Matsuyama
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Semiconductor relay device
    • Patent number 7,235,803
    • Issue date Jun 26, 2007
    • Kabushiki Kaisha Toshiba
    • Hiroshi Matsuyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Apparatus for optically transmitting data between rotor and stator...
    • Patent number 6,700,947
    • Issue date Mar 2, 2004
    • Kabushiki Kaisha Toshiba
    • Shigeru Oshima
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Array device having functional circuit for a plurality of channels
    • Patent number 5,883,546
    • Issue date Mar 16, 1999
    • Kabushiki Kaisha Toshiba
    • Katsuji Kaminishi
    • G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20200304035
    • Publication date Sep 24, 2020
    • KABUSHIKI KAISHA TOSHIBA
    • Eitaro MIYAKE
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20200243490
    • Publication date Jul 30, 2020
    • Kabushiki Kaisha Toshiba
    • Hiroshi Matsuyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    TERMINAL PLATE AND SEMICONDUCTOR DEVICE
    • Publication number 20200091043
    • Publication date Mar 19, 2020
    • Kabushiki Kaisha Toshiba
    • Eitaro Miyake
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20200091118
    • Publication date Mar 19, 2020
    • Kabushiki Kaisha Toshiba
    • Hiroshi Matsuyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20190295970
    • Publication date Sep 26, 2019
    • Kabushiki Kaisha Toshiba
    • Hiroshi Matsuyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20170271247
    • Publication date Sep 21, 2017
    • Kabushiki Kaisha Toshiba
    • Shigeaki HAYASE
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20170256483
    • Publication date Sep 7, 2017
    • Kabushiki Kaisha Toshiba
    • Hiroshi Matsuyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR PACKAGE
    • Publication number 20170069569
    • Publication date Mar 9, 2017
    • Kabushiki Kaisha Toshiba
    • Hiroshi Matsuyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR MODULE
    • Publication number 20160057864
    • Publication date Feb 25, 2016
    • Kabushiki Kaisha Toshiba
    • Hiroshi Matsuyama
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    POWER SEMICONDUCTOR MODULE
    • Publication number 20150255442
    • Publication date Sep 10, 2015
    • Kabushiki Kaisha Toshiba
    • Hiroshi Matsuyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    INTERRUPTER
    • Publication number 20090128794
    • Publication date May 21, 2009
    • Kabushiki Kaisha Toshiba
    • Hiroshi Matsuyama
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    OPTICAL COUPLING DEVICE
    • Publication number 20070187629
    • Publication date Aug 16, 2007
    • Kabushiki Kaisha Toshiba
    • Hiroshi MATSUYAMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor relay device
    • Publication number 20060027735
    • Publication date Feb 9, 2006
    • KABUSHIKI KAISHA TOSHIBA
    • Hiroshi Matsuyama
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    Apparatus for optically transmitting data between rotor and stator...
    • Publication number 20020015469
    • Publication date Feb 7, 2002
    • Shigeru Oshima
    • G01 - MEASURING TESTING