Hiroshi Misawa

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Temperature control method and temperature control device
- Patent number 7,921,906
- Issue date Apr 12, 2011
- Fujitsu Semiconductor Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and stacked semiconductor device that can incr...
- Patent number 7,196,418
- Issue date Mar 27, 2007
- Fujitsu Limited
- Takao Ohno
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Temperature control method and temperature control device
- Publication number 20060245161
- Publication date Nov 2, 2006
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and stacked semiconductor device that can incr...
- Publication number 20050161793
- Publication date Jul 28, 2005
- Takao Ohno
- H01 - BASIC ELECTRIC ELEMENTS