Hiroshi Morioka

Person

Ebina-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for analyzing the state of generation of forei...
- Patent number 7,177,020
- Issue date Feb 13, 2007
- Renesas Technology Corp.
- Hiroshi Morioka
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting a pattern and an apparatus thereof and a metho...
- Patent number 7,116,816
- Issue date Oct 3, 2006
- Hitachi, Ltd.
- Maki Tanaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method, apparatus and system for circuit pattern
- Patent number 6,919,564
- Issue date Jul 19, 2005
- Hitachi, Ltd.
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method, apparatus and system for circuit pattern
- Patent number 6,903,821
- Issue date Jun 7, 2005
- Hitachi, Ltd.
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for analyzing the state of generation of forei...
- Patent number 6,894,773
- Issue date May 17, 2005
- Renesas Technology Corp.
- Hiroshi Morioka
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method, apparatus and system for circuit pattern
- Patent number 6,759,655
- Issue date Jul 6, 2004
- Hitachi, Ltd.
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting circuit pattern and inspecting instrument
- Patent number 6,703,850
- Issue date Mar 9, 2004
- Hitachi, Ltd.
- Mari Nozoe
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Semiconductor device producing method, system for carrying out the...
- Patent number 6,650,409
- Issue date Nov 18, 2003
- Hitachi, Ltd.
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting circuit pattern and inspecting instrument
- Patent number 6,583,634
- Issue date Jun 24, 2003
- Hitachi, Ltd.
- Mari Nozoe
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Inspection method, apparatus and system for circuit pattern
- Patent number 6,504,609
- Issue date Jan 7, 2003
- Hitachi, Ltd.
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method, apparatus and system for circuit pattern
- Patent number 6,493,082
- Issue date Dec 10, 2002
- Hitachi, Ltd.
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method, apparatus and system for circuit pattern
- Patent number 6,480,279
- Issue date Nov 12, 2002
- Hitachi, Ltd.
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method, apparatus and system for circuit pattern
- Patent number 6,476,913
- Issue date Nov 5, 2002
- Hitachi, Ltd.
- Kazuhisa Machida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method, apparatus and system for circuit pattern
- Patent number 6,421,122
- Issue date Jul 16, 2002
- Hitachi, Ltd.
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method, apparatus and system for circuit pattern
- Patent number 6,388,747
- Issue date May 14, 2002
- Hitachi, Ltd.
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for analyzing the state of generation of forei...
- Patent number 5,463,459
- Issue date Oct 31, 1995
- Hitachi, Ltd.
- Hiroshi Morioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for inspecting foreign particles on real time...
- Patent number 5,274,434
- Issue date Dec 28, 1993
- Hitachi, Ltd.
- Hiroshi Morioka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of inspecting foreign matters during mass prod...
- Patent number 5,233,191
- Issue date Aug 3, 1993
- Hitachi, Ltd.
- Minori Noguchi
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for analyzing the state of generation of forei...
- Publication number 20050206887
- Publication date Sep 22, 2005
- Hiroshi Morioka
- G01 - MEASURING TESTING
Information Patent Application
Method of inspecting circuit pattern and inspecting instrument
- Publication number 20030206027
- Publication date Nov 6, 2003
- Hitachi, Ltd.
- Mari Nozoe
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Inspection method, apparatus and system for circuit pattern
- Publication number 20030058444
- Publication date Mar 27, 2003
- Hitachi, Ltd
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection method, apparatus and system for circuit pattern
- Publication number 20020113967
- Publication date Aug 22, 2002
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection method, apparatus and system for circuit pattern
- Publication number 20020109088
- Publication date Aug 15, 2002
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection method, apparatus and system for circuit pattern
- Publication number 20020105648
- Publication date Aug 8, 2002
- Hitachi, Ltd
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of inspecting a pattern and an apparatus thereof and a metho...
- Publication number 20010033683
- Publication date Oct 25, 2001
- Maki Tanaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection method, apparatus and system for circuit pattern
- Publication number 20010021019
- Publication date Sep 13, 2001
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for analyzing the state of generation of forei...
- Publication number 20010021015
- Publication date Sep 13, 2001
- Hiroshi Morioka
- B82 - NANO-TECHNOLOGY
Information Patent Application
Inspection method, apparatus and system for circuit pattern
- Publication number 20010019411
- Publication date Sep 6, 2001
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection method, apparatus and system for circuit pattern
- Publication number 20010015805
- Publication date Aug 23, 2001
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection method, apparatus and system for circuit pattern
- Publication number 20010011706
- Publication date Aug 9, 2001
- Yasuhiko Nara
- G06 - COMPUTING CALCULATING COUNTING

Hiroshi Morioka

Person

Patents Grantslast 30 patents

Method and apparatus for analyzing the state of generation of forei...

Method of inspecting a pattern and an apparatus thereof and a metho...

Inspection method, apparatus and system for circuit pattern

Inspection method, apparatus and system for circuit pattern

Method and apparatus for analyzing the state of generation of forei...

Inspection method, apparatus and system for circuit pattern

Method of inspecting circuit pattern and inspecting instrument

Semiconductor device producing method, system for carrying out the...

Method of inspecting circuit pattern and inspecting instrument

Inspection method, apparatus and system for circuit pattern

Inspection method, apparatus and system for circuit pattern

Inspection method, apparatus and system for circuit pattern

Inspection method, apparatus and system for circuit pattern

Inspection method, apparatus and system for circuit pattern

Inspection method, apparatus and system for circuit pattern

Method and apparatus for analyzing the state of generation of forei...

Method and apparatus for inspecting foreign particles on real time...

Method and apparatus of inspecting foreign matters during mass prod...

Patents Applicationslast 30 patents

Method and apparatus for analyzing the state of generation of forei...

Method of inspecting circuit pattern and inspecting instrument

Inspection method, apparatus and system for circuit pattern

Inspection method, apparatus and system for circuit pattern

Inspection method, apparatus and system for circuit pattern

Inspection method, apparatus and system for circuit pattern

Method of inspecting a pattern and an apparatus thereof and a metho...

Inspection method, apparatus and system for circuit pattern

Method and apparatus for analyzing the state of generation of forei...

Inspection method, apparatus and system for circuit pattern

Inspection method, apparatus and system for circuit pattern

Inspection method, apparatus and system for circuit pattern