Hiroshi Nada

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Current supply device and test system including the same
- Patent number 11,674,997
- Issue date Jun 13, 2023
- Keysight Technologies, Inc.
- Ken Yawata
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Source measure apparatus including feedback path and measurement path
- Patent number 11,619,666
- Issue date Apr 4, 2023
- Keysight Technologies, Inc.
- Nobuaki Iwaki
- G01 - MEASURING TESTING
Information Patent Grant
Current supply device and test system including the same
- Patent number 11,333,701
- Issue date May 17, 2022
- Keysight Technologies, Inc.
- Ken Yawata
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Capacitance measuring apparatus and capacitance measuring method
- Patent number 7,812,619
- Issue date Oct 12, 2010
- Agilent Technologies, Inc.
- Shinichi Tanida
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring the breakdown voltage of semicon...
- Patent number 5,285,151
- Issue date Feb 8, 1994
- Hewlett-Packard Company
- Hideo Akama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CURRENT SUPPLY DEVICE AND TEST SYSTEM INCLUDING THE SAME
- Publication number 20220236319
- Publication date Jul 28, 2022
- KEYSIGHT TECHNOLOGIES, INC.
- Ken Yawata
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
CURRENT SUPPLY DEVICE AND TEST SYSTEM INCLUDING THE SAME
- Publication number 20210231728
- Publication date Jul 29, 2021
- KEYSIGHT TECHNOLOGIES, INC.
- Ken Yawata
- G01 - MEASURING TESTING
Information Patent Application
Switch Module for Semiconductor Characteristic Measurement and Meas...
- Publication number 20090267634
- Publication date Oct 29, 2009
- Agilent Technologies, Inc.
- Hiroshi Nada
- G01 - MEASURING TESTING
Information Patent Application
Capacitance measuring apparatus and capacitance measuring method
- Publication number 20080068029
- Publication date Mar 20, 2008
- AGILENT TECHNOLOGIES, INC.
- Shinichi Tanida
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for a reliability testing
- Publication number 20060208754
- Publication date Sep 21, 2006
- AGILENT TECHNOLOGIES, INC.
- Yasuhiro Takeuchi
- G01 - MEASURING TESTING