Hiroshi Naganuma

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electronic component package
- Patent number 11,721,618
- Issue date Aug 8, 2023
- TDK Corporation
- Yosuke Komasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Correction apparatus and method for angle sensor, and angle sensor
- Patent number 10,254,135
- Issue date Apr 9, 2019
- TDK Corporation
- Shinichirou Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field detection apparatus and rotation detection apparatus
- Patent number 10,082,406
- Issue date Sep 25, 2018
- TDK Corporation
- Hiroshi Naganuma
- G01 - MEASURING TESTING
Information Patent Grant
Correction apparatus for angle sensor, and angle sensor
- Patent number 10,006,789
- Issue date Jun 26, 2018
- TDK Corporation
- Shinichirou Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Rotation angle sensor
- Patent number 8,749,229
- Issue date Jun 10, 2014
- TDK Corporation
- Hiroshi Naganuma
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 8,593,139
- Issue date Nov 26, 2013
- TDK Corporation
- Naoki Ohta
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC COMPONENT PACKAGE
- Publication number 20230326839
- Publication date Oct 12, 2023
- TDK Corporation
- Yosuke KOMASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC COMPONENT PACKAGE
- Publication number 20210020552
- Publication date Jan 21, 2021
- TDK Corporation
- Yosuke KOMASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CORRECTION APPARATUS FOR ANGLE SENSOR, AND ANGLE SENSOR
- Publication number 20170314975
- Publication date Nov 2, 2017
- TDK Corporation
- Shinichirou MOCHIZUKI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD DETECTION APPARATUS AND ROTATION DETECTION APPARATUS
- Publication number 20170059362
- Publication date Mar 2, 2017
- TDK Corporation
- Hiroshi NAGANUMA
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION APPARATUS AND METHOD FOR ANGLE SENSOR, AND ANGLE SENSOR
- Publication number 20170030742
- Publication date Feb 2, 2017
- TDK Corporation
- Shinichirou MOCHIZUKI
- G01 - MEASURING TESTING
Information Patent Application
ROTATION ANGLE SENSOR
- Publication number 20120176126
- Publication date Jul 12, 2012
- TDK Corporation
- Hiroshi NAGANUMA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20110221433
- Publication date Sep 15, 2011
- TDK Corporation
- Naoki OHTA
- G01 - MEASURING TESTING