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Hiroshi Naiki

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Patents Grantslast 30 patents

  • Information Patent Grant

    Defect inspection apparatus
    • Patent number 6,954,268
    • Issue date Oct 11, 2005
    • Olympus Corporation
    • Hiroshi Naiki
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    MICROSCOPE
    • Publication number 20110169936
    • Publication date Jul 14, 2011
    • OLYMPUS CORPORATION
    • Hiroshi NAIKI
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    VISUAL INSPECTION APPARATUS
    • Publication number 20090097737
    • Publication date Apr 16, 2009
    • OLYMPUS CORPORATION
    • Katsuyuki HASHIMOTO
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    PATTERN ALIGNMENT METHOD, PATTERN INSPECTION APPARATUS, AND PATTERN...
    • Publication number 20080144922
    • Publication date Jun 19, 2008
    • OLYMPUS CORPORATION
    • Hiroshi Naiki
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Visual inspection apparatus
    • Publication number 20060238753
    • Publication date Oct 26, 2006
    • OLYMPUS CORPORATION
    • Haruyuki Tsuji
    • G01 - MEASURING TESTING
  • Information Patent Application

    Defect inspection apparatus
    • Publication number 20040174518
    • Publication date Sep 9, 2004
    • OLYMPUS CORPORATION
    • Hiroshi Naiki
    • G01 - MEASURING TESTING