Hiroshi Nakajima

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Chigasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Optical surface defect inspection apparatus and optical surface def...
- Patent number 8,547,547
- Issue date Oct 1, 2013
- Hitachi High-Technologies Corporation
- Shintaro Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect inspection method and apparatus
- Patent number 8,502,966
- Issue date Aug 6, 2013
- Hitachi High-Technologies Corporation
- Kenichi Shitara
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect inspection method and apparatus
- Patent number 8,488,116
- Issue date Jul 16, 2013
- Hitachi High-Technologies Corporation
- Kenichi Shitara
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect inspection method and apparatus
- Patent number 8,294,888
- Issue date Oct 23, 2012
- Hitachi High-Technologies Corporation
- Kenichi Shitara
- G01 - MEASURING TESTING
Information Patent Grant
Optical checking method and apparatus for defects in magnetic disks
- Patent number 8,208,356
- Issue date Jun 26, 2012
- Hitachi High-Technologies Corporation
- Ayumu Ishihara
- G11 - INFORMATION STORAGE
Information Patent Grant
Wafer thickness measuring apparatus and detection method thereof
- Patent number 6,353,473
- Issue date Mar 5, 2002
- Hitachi Electronics Engineering Co., Ltd.
- Hideo Ishimori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL SURFACE DEFECT INSPECTION APPARATUS AND OPTICAL SURFACE DEF...
- Publication number 20120075625
- Publication date Mar 29, 2012
- Shintaro TAMURA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CHECKING METHOD AND APPARATUS FOR DEFECTS IN MAGNETIC DISKS
- Publication number 20110158073
- Publication date Jun 30, 2011
- Ayumu ISHIHARA
- G11 - INFORMATION STORAGE
Information Patent Application
SURFACE DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20110075148
- Publication date Mar 31, 2011
- Hitachi High-Technologies Corporation
- Kenichi SHITARA
- G01 - MEASURING TESTING