Hiroshi Niikura

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Chigasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for evaluating refractive index homogeneity of optical member
- Patent number 7,245,361
- Issue date Jul 17, 2007
- Nikon Corporation
- Yutaka Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Unit for measuring optical properties
- Patent number 6,128,093
- Issue date Oct 3, 2000
- Nikon Corporation
- Hiroshi Niikura
- G01 - MEASURING TESTING
Information Patent Grant
Obliquely deposited film element
- Patent number 5,932,354
- Issue date Aug 3, 1999
- Kabushiki Kaisha Toyota Chuo Kenkyusho
- Yasuhiko Takeda
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Method for evaluating refractive index homogeneity of optical member
- Publication number 20050140967
- Publication date Jun 30, 2005
- Nikon Corporation
- Yutaka Yamaguchi
- G01 - MEASURING TESTING