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Hiroshi Nishihama

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  • Hitachinaka, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Charged particle beam device
    • Patent number 11,670,481
    • Issue date Jun 6, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Motonobu Hommi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam apparatus
    • Patent number 10,755,890
    • Issue date Aug 25, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Shinya Ueno
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam device
    • Patent number 10,546,715
    • Issue date Jan 28, 2020
    • Hitachi High-Technologies Corporation
    • Shahedul Hoque
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Pattern measuring apparatus
    • Patent number 8,872,106
    • Issue date Oct 28, 2014
    • Hitachi High-Technologies Corporation
    • Hiroshi Nishihama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Pattern measuring apparatus
    • Patent number 8,618,517
    • Issue date Dec 31, 2013
    • Hitachi High-Technologies Corporation
    • Hiroshi Nishihama

Patents Applicationslast 30 patents

  • Information Patent Application

    Charged Particle Beam Device and Specimen Observation Method
    • Publication number 20230343549
    • Publication date Oct 26, 2023
    • Hitachi High-Tech Corporation
    • Masahiro FUKUTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20220165537
    • Publication date May 26, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Motonobu HOMMI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Apparatus
    • Publication number 20180286627
    • Publication date Oct 4, 2018
    • Hitachi High-Technologies Corporation
    • Shinya UENO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Beam Device
    • Publication number 20180269026
    • Publication date Sep 20, 2018
    • Hitachi High-Technologies Corporation
    • Shahedul HOQUE
    • G02 - OPTICS
  • Information Patent Application

    PATTERN MEASURING APPARATUS
    • Publication number 20140021350
    • Publication date Jan 23, 2014
    • Hitachi High-Technologies Corporation
    • Hiroshi Nishihama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    PATTERN MEASURING APPARATUS
    • Publication number 20140021349
    • Publication date Jan 23, 2014
    • Hitachi High-Technologies Corporation
    • Hiroshi Nishihama
    • H01 - BASIC ELECTRIC ELEMENTS