TREA

Hiroshi Ohga

Follow

Person

  • Tokyo, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Sample test automation system
    • Patent number 10,816,564
    • Issue date Oct 27, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Takahiro Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Specimen transfer device and system
    • Patent number 10,094,748
    • Issue date Oct 9, 2018
    • Hitachi High-Technologies Corporation
    • Masashi Akutsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Reagent container and automatic analysis apparatus
    • Patent number 9,776,185
    • Issue date Oct 3, 2017
    • Hitachi High-Technologies Corporation
    • Hidenori Hisano
    • B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
  • Information Patent Grant

    Sample test automation system
    • Patent number 9,753,048
    • Issue date Sep 5, 2017
    • Hitachi High-Technologies Corporation
    • Takahiro Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Holder for transferring test tube
    • Patent number 9,636,681
    • Issue date May 2, 2017
    • Hitachi High-Technologies Corporation
    • Hiroshi Ohga
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Sample transport system and method for controlling the same
    • Patent number 9,483,048
    • Issue date Nov 1, 2016
    • Hitachi High-Technologies Corporation
    • Shigeru Yano
    • G05 - CONTROLLING REGULATING
  • Information Patent Grant

    Sample processing system
    • Patent number 9,476,806
    • Issue date Oct 25, 2016
    • Hitachi High-Technologies Corporation
    • Yoshiteru Hirama
    • B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
  • Information Patent Grant

    Sample processing system
    • Patent number 9,470,608
    • Issue date Oct 18, 2016
    • Hitachi High-Technologies Corporation
    • Kuniaki Onizawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Laboratory automation apparatus, automated analytical apparatus and...
    • Patent number 9,390,597
    • Issue date Jul 12, 2016
    • Hitachi High-Technologies Corporation
    • Shigeki Yamaguchi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated sample processing system
    • Patent number 9,291,633
    • Issue date Mar 22, 2016
    • Hitachi High-Technologies Corporation
    • Hiroshi Ohga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Holder for transferring test tube
    • Patent number 9,211,543
    • Issue date Dec 15, 2015
    • Hitachi High-Technologies Corporation
    • Hiroshi Ohga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated sample test system, and method for controlling same
    • Patent number 8,972,044
    • Issue date Mar 3, 2015
    • Hitachi High-Technologies Corporation
    • Atsushi Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated sample testing system
    • Patent number 8,877,128
    • Issue date Nov 4, 2014
    • Hitachi High-Technologies Corporation
    • Tatsuya Fukugaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample conveying system
    • Patent number 8,833,186
    • Issue date Sep 16, 2014
    • Hitachi High-Technologies Corporation
    • Tetsuya Isobe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 8,231,843
    • Issue date Jul 31, 2012
    • Hitachi High-Technologies Corporation
    • Hiroshi Ohga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Holder for test tube
    • Patent number D637311
    • Issue date May 3, 2011
    • Hitachi High-Technologies Corporation
    • Tetsuya Isobe
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Portion of a holder for test tube
    • Patent number D637312
    • Issue date May 3, 2011
    • Hitachi High-Technologies Corporation
    • Tetsuya Isobe
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Automatic analyzer
    • Patent number 7,727,469
    • Issue date Jun 1, 2010
    • Hitachi High-Technologies Corporation
    • Katsuaki Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 7,547,414
    • Issue date Jun 16, 2009
    • Hitachi High-Technologies Corporation
    • Masaharu Nishida
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SAMPLE TEST AUTOMATION SYSTEM
    • Publication number 20170328926
    • Publication date Nov 16, 2017
    • Hitachi High-Technologies Corporation
    • Takahiro Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    HOLDER FOR TRANSFERRING TEST TUBE
    • Publication number 20160144367
    • Publication date May 26, 2016
    • Hitachi High-Technologies Corporation
    • Hiroshi OHGA
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    REAGENT CONTAINER AND AUTOMATIC ANALYSIS APPARATUS
    • Publication number 20150290645
    • Publication date Oct 15, 2015
    • Hitachi High-Technologies Corporation
    • Hidenori Hisano
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE PROCESSING SYSTEM
    • Publication number 20140326082
    • Publication date Nov 6, 2014
    • Yoshiteru Hirama
    • G01 - MEASURING TESTING
  • Information Patent Application

    HOLDER FOR TRANSFERRING TEST TUBE
    • Publication number 20140301916
    • Publication date Oct 9, 2014
    • Hiroshi Ohga
    • G01 - MEASURING TESTING
  • Information Patent Application

    SPECIMEN TRANSFER DEVICE AND SYSTEM
    • Publication number 20140294699
    • Publication date Oct 2, 2014
    • Masashi Akutsu
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE TRANSPORT SYSTEM AND METHOD FOR CONTROLLING THE SAME
    • Publication number 20130310964
    • Publication date Nov 21, 2013
    • Hitachi High-Technologies Corporation
    • Shigeru Yano
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE PROCESSING SYSTEM
    • Publication number 20130202486
    • Publication date Aug 8, 2013
    • Kuniaki Onizawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    LABORATORY AUTOMATION APPARATUS, AUTOMATED ANALYTICAL APPARATUS AND...
    • Publication number 20130201019
    • Publication date Aug 8, 2013
    • Hitachi High-Technologies Corporation
    • Shigeki Yamaguchi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED SAMPLE TEST SYSTEM, AND METHOD FOR CONTROLLING SAME
    • Publication number 20130197690
    • Publication date Aug 1, 2013
    • Hitachi High-Technologies Corporation
    • Atsushi Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE TEST AUTOMATION SYSTEM
    • Publication number 20130061693
    • Publication date Mar 14, 2013
    • Hitachi High-Technologies Corporation
    • Takahiro Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE CONVEYING SYSTEM
    • Publication number 20120266698
    • Publication date Oct 25, 2012
    • Hitachi High-Technologies Corporation
    • Tetsuya Isobe
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED SAMPLE PROCESSING SYSTEM
    • Publication number 20120174687
    • Publication date Jul 12, 2012
    • Hitachi High-Technologies Corporation
    • Hiroshi Ohga
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED SAMPLE TESTING SYSTEM
    • Publication number 20120177547
    • Publication date Jul 12, 2012
    • Hitachi High-Technologies Corporation
    • Tatsuya Fukugaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20110267198
    • Publication date Nov 3, 2011
    • Hitachi High-Technologies Corporation
    • Hiroshi OHGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20090074614
    • Publication date Mar 19, 2009
    • Hiroshi OHGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20050047964
    • Publication date Mar 3, 2005
    • Masaharu Nishida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20040208787
    • Publication date Oct 21, 2004
    • Katsuaki Takahashi
    • G01 - MEASURING TESTING