Hiroshi OHNO

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Type 1 helper t cell-increasing agent, food and pharmaceutical
- Patent number 12,220,426
- Issue date Feb 11, 2025
- Daicel Corporation
- Hiroshi Ohno
- A23 - FOODS OR FOODSTUFFS THEIR TREATMENT, NOT COVERED BY OTHER CLASSES
Information Patent Grant
Optical inspection method, non-transitory storage medium storing op...
- Patent number 12,188,876
- Issue date Jan 7, 2025
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Processing device, measurement device, and measurement method
- Patent number 12,183,027
- Issue date Dec 31, 2024
- Kabushiki Kaisha Toshiba
- Kiminori Toya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Processing device relating to inspection of inspection object, insp...
- Patent number 12,136,238
- Issue date Nov 5, 2024
- Kabushiki Kaisha Toshiba
- Nobukatsu Sugiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical apparatus, optical inspection method and non-transitory sto...
- Patent number 12,123,703
- Issue date Oct 22, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection device
- Patent number 12,092,582
- Issue date Sep 17, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Optical imaging apparatus, robot hand, moving body, and LiDAR appar...
- Patent number 11,977,182
- Issue date May 7, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection method, optical inspection device, and non-trans...
- Patent number 11,977,022
- Issue date May 7, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical apparatus
- Patent number 11,954,884
- Issue date Apr 9, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical inspection method, non-transitory storage medium storing op...
- Patent number 11,906,439
- Issue date Feb 20, 2024
- Kaushiki Kaisha Toshiba
- Hiroya Kano
- G01 - MEASURING TESTING
Information Patent Grant
Intestinal immune-enhancing agent, food product, and medicament
- Patent number 11,896,043
- Issue date Feb 13, 2024
- Daicel Corporation
- Tadashi Takeuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical element, lighting apparatus and solar cell device
- Patent number 11,888,438
- Issue date Jan 30, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Non-contact non-destructive inspection system, signal processing de...
- Patent number 11,879,815
- Issue date Jan 23, 2024
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Grant
Optical element assembly, optical imaging device, and optical proce...
- Patent number 11,803,094
- Issue date Oct 31, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G02 - OPTICS
Information Patent Grant
Optical imaging apparatus, optical inspection apparatus, and optica...
- Patent number 11,774,369
- Issue date Oct 3, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Optical apparatus
- Patent number 11,758,278
- Issue date Sep 12, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical test apparatus and optical test method
- Patent number 11,693,162
- Issue date Jul 4, 2023
- Kabushiki Kaisha Toshiba
- Hiroya Kano
- G01 - MEASURING TESTING
Information Patent Grant
Optical deflection element, beam steering apparatus and moving body
- Patent number 11,567,176
- Issue date Jan 31, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Nozzle and additive manufacturing apparatus
- Patent number 11,534,968
- Issue date Dec 27, 2022
- TECHNOLOGY RESEARCH ASSOCIATION FOR FUTURE ADDITIVE MANUFACTURING
- Hiroshi Ohno
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Optical test apparatus and optical test method
- Patent number 11,536,652
- Issue date Dec 27, 2022
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Grant
Detection apparatus, convergence member, and noise cancellation system
- Patent number 11,474,074
- Issue date Oct 18, 2022
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Optical inspection apparatus
- Patent number 11,415,510
- Issue date Aug 16, 2022
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G02 - OPTICS
Information Patent Grant
Measurement method and measurement apparatus
- Patent number 11,386,570
- Issue date Jul 12, 2022
- Kabushiki Kaisha Toshiba
- Kiminori Toya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical device, information processing method, and computer program...
- Patent number 11,333,492
- Issue date May 17, 2022
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical test apparatus and optical test method
- Patent number 11,297,308
- Issue date Apr 5, 2022
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus for inspecting object surface
- Patent number 11,249,028
- Issue date Feb 15, 2022
- Kabushiki Kaisha Toshiba
- Takahiro Kamikawa
- G01 - MEASURING TESTING
Information Patent Grant
Container
- Patent number 11,091,312
- Issue date Aug 17, 2021
- OTSUKA TECHNO CORPORATION
- Kosuke Tojo
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Nozzle and additive manufacturing apparatus
- Patent number 10,974,320
- Issue date Apr 13, 2021
- Kabushiki Kaisha Toshiba
- Shanying Pan
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Nozzle device and additive manufacturing apparatus
- Patent number 10,974,345
- Issue date Apr 13, 2021
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Laser processing device
- Patent number 10,946,481
- Issue date Mar 16, 2021
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL APPARATUS, OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION...
- Publication number 20250044235
- Publication date Feb 6, 2025
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING APPARATUS, OPTICAL INSPECTION SYSTEM, SUBJECT SURFACE IM...
- Publication number 20250014311
- Publication date Jan 9, 2025
- Kabushiki Kaisha Toshiba
- Hiroya KANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM, AND OPTIC...
- Publication number 20240319078
- Publication date Sep 26, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION METHOD AND STORAGE MEDIUM, AND OPTICAL INSPECTIO...
- Publication number 20240319111
- Publication date Sep 26, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TR...
- Publication number 20240319104
- Publication date Sep 26, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT METHOD, OPTICAL MEASUREMENT APPARATUS, AND NON-...
- Publication number 20240319486
- Publication date Sep 26, 2024
- Kabushiki Kaisha Toshiba
- Kenta TAKANASHI
- G02 - OPTICS
Information Patent Application
METHOD OF CALCULATING THREE-DIMENSIONAL SHAPE INFORMATION OF OBJECT...
- Publication number 20240102796
- Publication date Mar 28, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
NON-TRANSITORY STORAGE MEDIUM, OPTICAL INSPECTION SYSTEM, PROCESSIN...
- Publication number 20240094115
- Publication date Mar 21, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION SYSTEM, OPTICAL IN...
- Publication number 20240094114
- Publication date Mar 21, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL IMAGING APPARATUS, PROCESSING APPARATUS, OPTICAL IMAGING ME...
- Publication number 20240077412
- Publication date Mar 7, 2024
- Kabushiki Kaisha Toshiba
- Hiroya KANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL APPARATUS, OPTICAL INSPECTION METHOD AND NON-TRANSITORY STO...
- Publication number 20240053141
- Publication date Feb 15, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION ACQUISITION APPARATUS...
- Publication number 20240011918
- Publication date Jan 11, 2024
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS, PROCESSING DEVICE, OPTICAL INSPECTION...
- Publication number 20230324309
- Publication date Oct 12, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...
- Publication number 20230314335
- Publication date Oct 5, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...
- Publication number 20230304929
- Publication date Sep 28, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD
- Publication number 20230288619
- Publication date Sep 14, 2023
- Kabushiki Kaisha Toshiba
- Hiroya KANO
- G01 - MEASURING TESTING
Information Patent Application
SURFACE EMITTING QUANTUM CASCADE LASER
- Publication number 20230163567
- Publication date May 25, 2023
- National Institute for Materials Science
- Kazuaki SAKODA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESSING DEVICE, MEASUREMENT DEVICE, AND MEASUREMENT METHOD
- Publication number 20230120069
- Publication date Apr 20, 2023
- Kabushiki Kaisha Toshiba
- Kiminori TOYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD
- Publication number 20230099653
- Publication date Mar 30, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ELEMENT ASSEMBLY, OPTICAL APPARATUS, ESTIMATION METHOD, AND...
- Publication number 20230090825
- Publication date Mar 23, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...
- Publication number 20230077793
- Publication date Mar 16, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING APPARATUS, OPTICAL APPARATUS, MANUFACTURING APPARATUS, P...
- Publication number 20230080677
- Publication date Mar 16, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURFACE-EMITTING SEMICONDUCTOR LIGHT-EMITTING DEVICE
- Publication number 20230070461
- Publication date Mar 9, 2023
- Kabushiki Kaisha Toshiba
- Rei HASHIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESSING DEVICE RELATING TO INSPECTION OF INSPECTION OBJECT, INSP...
- Publication number 20230071341
- Publication date Mar 9, 2023
- Kabushiki Kaisha Toshiba
- Nobukatsu Sugiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...
- Publication number 20230066704
- Publication date Mar 2, 2023
- Kabushiki Kaisha Toshiba
- Hiroya KANO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL APPARATUS, OPTICAL INSPECTION METHOD AND NON-TRANSITORY STO...
- Publication number 20230062169
- Publication date Mar 2, 2023
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION METHOD, OPTICAL INSPECTION DEVICE, AND NON-TRANS...
- Publication number 20220299429
- Publication date Sep 22, 2022
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-CONTACT NON-DESTRUCTIVE INSPECTION SYSTEM, SIGNAL PROCESSING DE...
- Publication number 20220170813
- Publication date Jun 2, 2022
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL IMAGING APPARATUS, OPTICAL INSPECTION APPARATUS, AND OPTICA...
- Publication number 20220146435
- Publication date May 12, 2022
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MACHINING APPARATUS
- Publication number 20220080528
- Publication date Mar 17, 2022
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Hiroshi OHNO

Person

Patents Grantslast 30 patents

Type 1 helper t cell-increasing agent, food and pharmaceutical

Optical inspection method, non-transitory storage medium storing op...

Processing device, measurement device, and measurement method

Processing device relating to inspection of inspection object, insp...

Optical apparatus, optical inspection method and non-transitory sto...

Optical inspection device

Optical imaging apparatus, robot hand, moving body, and LiDAR appar...

Optical inspection method, optical inspection device, and non-trans...

Optical apparatus

Optical inspection method, non-transitory storage medium storing op...

Intestinal immune-enhancing agent, food product, and medicament

Optical element, lighting apparatus and solar cell device

Non-contact non-destructive inspection system, signal processing de...

Optical element assembly, optical imaging device, and optical proce...

Optical imaging apparatus, optical inspection apparatus, and optica...

Optical apparatus

Optical test apparatus and optical test method

Optical deflection element, beam steering apparatus and moving body

Nozzle and additive manufacturing apparatus

Optical test apparatus and optical test method

Detection apparatus, convergence member, and noise cancellation system

Optical inspection apparatus

Measurement method and measurement apparatus

Optical device, information processing method, and computer program...

Optical test apparatus and optical test method

Apparatus for inspecting object surface

Container

Nozzle and additive manufacturing apparatus

Nozzle device and additive manufacturing apparatus

Laser processing device

Patents Applicationslast 30 patents

OPTICAL APPARATUS, OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION...

PROCESSING APPARATUS, OPTICAL INSPECTION SYSTEM, SUBJECT SURFACE IM...

OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM, AND OPTIC...

OPTICAL INSPECTION METHOD AND STORAGE MEDIUM, AND OPTICAL INSPECTIO...

OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TR...

OPTICAL MEASUREMENT METHOD, OPTICAL MEASUREMENT APPARATUS, AND NON-...

METHOD OF CALCULATING THREE-DIMENSIONAL SHAPE INFORMATION OF OBJECT...

NON-TRANSITORY STORAGE MEDIUM, OPTICAL INSPECTION SYSTEM, PROCESSIN...

OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION SYSTEM, OPTICAL IN...

OPTICAL IMAGING APPARATUS, PROCESSING APPARATUS, OPTICAL IMAGING ME...

OPTICAL APPARATUS, OPTICAL INSPECTION METHOD AND NON-TRANSITORY STO...

INFORMATION PROCESSING APPARATUS, INFORMATION ACQUISITION APPARATUS...

OPTICAL INSPECTION APPARATUS, PROCESSING DEVICE, OPTICAL INSPECTION...

OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...

OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...

OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD

SURFACE EMITTING QUANTUM CASCADE LASER

PROCESSING DEVICE, MEASUREMENT DEVICE, AND MEASUREMENT METHOD

OPTICAL TEST APPARATUS AND OPTICAL TEST METHOD

OPTICAL ELEMENT ASSEMBLY, OPTICAL APPARATUS, ESTIMATION METHOD, AND...

OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...

PROCESSING APPARATUS, OPTICAL APPARATUS, MANUFACTURING APPARATUS, P...

SURFACE-EMITTING SEMICONDUCTOR LIGHT-EMITTING DEVICE

PROCESSING DEVICE RELATING TO INSPECTION OF INSPECTION OBJECT, INSP...

OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OP...

OPTICAL APPARATUS, OPTICAL INSPECTION METHOD AND NON-TRANSITORY STO...

OPTICAL INSPECTION METHOD, OPTICAL INSPECTION DEVICE, AND NON-TRANS...

NON-CONTACT NON-DESTRUCTIVE INSPECTION SYSTEM, SIGNAL PROCESSING DE...

OPTICAL IMAGING APPARATUS, OPTICAL INSPECTION APPARATUS, AND OPTICA...

OPTICAL MACHINING APPARATUS