Hiroshi Oinuma

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device, computer, and signal processing metho...
- Patent number 11,898,974
- Issue date Feb 13, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Oinuma
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device and charged particle beam device calib...
- Patent number 11,848,171
- Issue date Dec 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Akio Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT SYSTEM AND METHOD OF SETTING PARAMETER OF CHARGED PARTI...
- Publication number 20230059414
- Publication date Feb 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Hiroshi OINUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM DEVICE CALIB...
- Publication number 20220246392
- Publication date Aug 4, 2022
- HITACHI HIGH-TECH CORPORATION
- Akio YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, COMPUTER, AND SIGNAL PROCESSING METHO...
- Publication number 20220187228
- Publication date Jun 16, 2022
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Oinuma
- G01 - MEASURING TESTING