Hiroshi Okada

Follow

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of determining impurity content and apparatus for the same
- Patent number 6,278,267
- Issue date Aug 21, 2001
- Dainippon Screen Mfg. Co., Ltd.
- Hiroshi Okada
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for electrical measurement of semiconductor wa...
- Patent number 5,504,437
- Issue date Apr 2, 1996
- Dainippon Screen Mfg. Co., Ltd.
- Sadao Hirae
- G01 - MEASURING TESTING