Hiroshi OOTA

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Yokkaichi Mie, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 12,205,875
- Issue date Jan 21, 2025
- Kioxia Corporation
- Satoshi Tsukiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection device and inspection method
- Patent number 11,151,709
- Issue date Oct 19, 2021
- TOSHIBA MEMORY CORPORATION
- Hiroshi Oota
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20230058480
- Publication date Feb 23, 2023
- KIOXIA Corporation
- Satoshi TSUKIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection Device and Inspection Method
- Publication number 20200273158
- Publication date Aug 27, 2020
- Toshiba Memory Corporation
- Hiroshi OOTA
- G06 - COMPUTING CALCULATING COUNTING