Hiroshi SAKAMAE

Follow

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray analysis device and peak search method
- Patent number 11,435,303
- Issue date Sep 6, 2022
- Shimadzu Corporation
- Hiroshi Sakamae
- G01 - MEASURING TESTING
Information Patent Grant
Electron probe microanalyzer and storage medium
- Patent number 10,410,825
- Issue date Sep 10, 2019
- Shimadzu Corporation
- Hiroshi Sakamae
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
X-RAY ANALYSIS DEVICE AND PEAK SEARCH METHOD
- Publication number 20210356413
- Publication date Nov 18, 2021
- Shimadzu Corporation
- Hiroshi SAKAMAE
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON PROBE MICROANALYZER AND STORAGE MEDIUM
- Publication number 20190006146
- Publication date Jan 3, 2019
- Shimadzu Corporation
- Hiroshi SAKAMAE
- G01 - MEASURING TESTING