Hiroshi Sakayori

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Patents Grantslast 30 patents

Information Patent Grant
Current measurement circuit, current detection circuit and saturati...
- Patent number 7,994,771
- Issue date Aug 9, 2011
- Agilent Technologies, Inc.
- Hiroshi Sakayori
- G01 - MEASURING TESTING
Information Patent Grant
Calibration apparatus and method using pulse for frequency, phase,...
- Patent number 7,315,170
- Issue date Jan 1, 2008
- Verigy (Singapore) Pte. Ltd.
- Hiroshi Sakayori
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for calibrating high frequency signal measurement equipment
- Patent number 6,958,612
- Issue date Oct 25, 2005
- Agilent Technologies, Inc.
- Hiroshi Sakayori
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing integrated circuits having an integrated unit...
- Patent number 6,864,699
- Issue date Mar 8, 2005
- Agilent Technologies, Inc.
- Hiroshi Sakayori
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing integrated circuits having an integrated unit...
- Patent number 6,737,881
- Issue date May 18, 2004
- Agilent Technologies, Inc.
- Hiroshi Sakayori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Current Measurement Circuit, Current Detection Circuit And Saturati...
- Publication number 20100085034
- Publication date Apr 8, 2010
- AGILENT TECHNOLOGIES, INC.
- Hiroshi Sakayori
- G01 - MEASURING TESTING
Information Patent Application
Calibration apparatus and method using pulse for frequency, phase,...
- Publication number 20060241887
- Publication date Oct 26, 2006
- AGILENT TECHNOLOGIES, INC.
- Hiroshi Sakayori
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for testing integrated circuits
- Publication number 20040178816
- Publication date Sep 16, 2004
- AGILENT TECHNOLOGIES, INC.
- Hiroshi Sakayori
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for calibrating high frequency signal measurement equipment
- Publication number 20030234654
- Publication date Dec 25, 2003
- AGILENT TECHNOLOGIES, INC.
- Hiroshi Sakayori
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for testing integrated circuits
- Publication number 20020140451
- Publication date Oct 3, 2002
- AGILENT TECHNOLOGIES, INC.
- Hiroshi Sakayori
- G01 - MEASURING TESTING