Membership
Tour
Register
Log in
Hiroshi Satozono
Follow
Person
Hamamatsu-shi, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Terahertz wave attenuated total reflection spectroscopic method, te...
Patent number
11,774,357
Issue date
Oct 3, 2023
Hamamatsu Photonics K.K.
Kazuhiro Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Amyloid β oligomer detection method, amyloid β oligomer detection d...
Patent number
11,402,328
Issue date
Aug 2, 2022
Hamamatsu Photonics K.K.
Akinori Oda
G01 - MEASURING TESTING
Information
Patent Grant
Liquid-liquid extraction methods for purifying and producing pure t...
Patent number
11,401,248
Issue date
Aug 2, 2022
Hamamatsu Photonics K.K.
Hiroshi Satozono
C07 - ORGANIC CHEMISTRY
Information
Patent Grant
Polymer resin orientation evaluation method
Patent number
11,371,935
Issue date
Jun 28, 2022
Hamamatsu Photonics K.K.
Atsushi Nakanishi
G01 - MEASURING TESTING
Information
Patent Grant
Fermentation state monitoring apparatus and fermentation state moni...
Patent number
11,293,859
Issue date
Apr 5, 2022
HAMAMATSU PHOTONICS K.K.
Kouichiro Akiyama
G01 - MEASURING TESTING
Information
Patent Grant
Method for purifying pure thioflavin T, method for producing pure t...
Patent number
11,186,557
Issue date
Nov 30, 2021
Hamamatsu Photonics K.K.
Akinori Oda
C07 - ORGANIC CHEMISTRY
Information
Patent Grant
Optical measurement device and optical measurement method
Patent number
10,809,189
Issue date
Oct 20, 2020
Hamamatsu Photonics K.K.
Kazuki Horita
G01 - MEASURING TESTING
Information
Patent Grant
Circular dichroism measuring method and circular dichroism measurin...
Patent number
10,663,391
Issue date
May 26, 2020
Hamamatsu Photonics K.K.
Hiroshi Satozono
G01 - MEASURING TESTING
Information
Patent Grant
Circular dichroism measuring method and circular dichroism measurin...
Patent number
10,330,590
Issue date
Jun 25, 2019
Hamamatsu Photonics K.K.
Hiroshi Satozono
G01 - MEASURING TESTING
Information
Patent Grant
Evaluation method for evaluating a state of a photosynthesis sample
Patent number
8,798,931
Issue date
Aug 5, 2014
Hamamatsu Photonics K.K.
Masakazu Katsumata
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF MANUFACTURING RESIN MEMBER, AND RESIN MEMBER
Publication number
20240218140
Publication date
Jul 4, 2024
HAMAMATSU PHOTONICS K. K.
Atsushi NAKANISHI
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Application
DISPERSION STABILITY EVALUATION METHOD, AND DISPERSION STABILITY CO...
Publication number
20240142360
Publication date
May 2, 2024
Hamamatsu Photonics K.K.
Kazuhiro TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
HYGROSCOPICITY EVALUATION METHOD AND WATER CONTENT EVALUATION METHOD
Publication number
20230258620
Publication date
Aug 17, 2023
HAMAMATSU PHOTONICS K. K.
Tetsuya UCHIDA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ELEMENT
Publication number
20230130965
Publication date
Apr 27, 2023
HAMAMATSU PHOTONICS K. K.
Yoichi KAWADA
G02 - OPTICS
Information
Patent Application
METHOD FOR REMOVING BACKGROUND OF FLUORESCENCE LIFETIME MEASUREMENT...
Publication number
20220404280
Publication date
Dec 22, 2022
HAMAMATSU PHOTONICS K. K.
Akinori ODA
G01 - MEASURING TESTING
Information
Patent Application
AMYLOID BETA OLIGOMER DETECTION METHOD, AMYLOID BETA OLIGOMER DETEC...
Publication number
20220357276
Publication date
Nov 10, 2022
HAMAMATSU PHOTONICS K. K.
Akinori ODA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD
Publication number
20220236416
Publication date
Jul 28, 2022
HAMAMATSU PHOTONICS K. K.
Hisanari TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ WAVE ATTENUATED TOTAL REFLECTION SPECTROSCOPIC METHOD, TE...
Publication number
20220091027
Publication date
Mar 24, 2022
HAMAMATSU PHOTONICS K. K.
Kazuhiro TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ELEMENT
Publication number
20210041600
Publication date
Feb 11, 2021
HAMAMATSU PHOTONICS K. K.
Yoichi KAWADA
G02 - OPTICS
Information
Patent Application
POLYMER RESIN ORIENTATION EVALUATION METHOD
Publication number
20210010934
Publication date
Jan 14, 2021
HAMAMATSU PHOTONICS K. K.
Atsushi NAKANISHI
G01 - MEASURING TESTING
Information
Patent Application
FERMENTATION STATE MONITORING APPARATUS AND FERMENTATION STATE MONI...
Publication number
20200173916
Publication date
Jun 4, 2020
HAMAMATSU PHOTONICS K. K.
Kouichiro AKIYAMA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD
Publication number
20190271642
Publication date
Sep 5, 2019
HAMAMATSU PHOTONICS K. K.
Kazuki HORITA
G01 - MEASURING TESTING
Information
Patent Application
CIRCULAR DICHROISM MEASURING METHOD AND CIRCULAR DICHROISM MEASURIN...
Publication number
20190271639
Publication date
Sep 5, 2019
HAMAMATSU PHOTONICS K. K.
Hiroshi SATOZONO
G01 - MEASURING TESTING
Information
Patent Application
AMYLOID BETA OLIGOMER DETECTION METHOD, AMYLOID BETA OLIGOMER DETEC...
Publication number
20190056324
Publication date
Feb 21, 2019
Hamamatsu Photonics K.K.
Akinori ODA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR PURIFYING PURE THIOFLAVIN T, METHOD FOR PRODUCING PURE T...
Publication number
20180273498
Publication date
Sep 27, 2018
Hamamatsu Photonics K.K.
Akinori ODA
C07 - ORGANIC CHEMISTRY
Information
Patent Application
METHOD FOR REFINING PURE THIOFLAVIN T, METHOD FOR PRODUCING PURE TH...
Publication number
20180273497
Publication date
Sep 27, 2018
Hamamatsu Photonics K.K.
Hiroshi SATOZONO
C07 - ORGANIC CHEMISTRY
Information
Patent Application
CIRCULAR DICHROISM MEASURING METHOD AND CIRCULAR DICHROISM MEASURIN...
Publication number
20170191928
Publication date
Jul 6, 2017
Hamamatsu Photonics K.K.
Hiroshi SATOZONO
G01 - MEASURING TESTING
Information
Patent Application
EVALUATION METHOD FOR PHOTOSYNTHESIS SAMPLE, EVALUATION SYSTEM FOR...
Publication number
20100159496
Publication date
Jun 24, 2010
HAMAMATSU PHOTONICS K. K.
Masakazu Katsumata
G01 - MEASURING TESTING