Hiroshi Sawaragi

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Chiba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for processing and observing a sample
- Patent number 6,870,161
- Issue date Mar 22, 2005
- SII NanoTechnology Inc.
- Tatsuya Adachi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Sample manufacturing apparatus
- Publication number 20040129897
- Publication date Jul 8, 2004
- Tatsuya Adachi
- G01 - MEASURING TESTING