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Hiroshi Shimoyama

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  • Nirasaki City, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Method for pre-heating probe card
    • Patent number 9,519,022
    • Issue date Dec 13, 2016
    • Tokyo Electron Limited
    • Hiroshi Yamada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Wafer inspection apparatus
    • Patent number 9,201,115
    • Issue date Dec 1, 2015
    • Tokyo Electron Limited
    • Hiroshi Yamada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Apparatus for driving placing table
    • Patent number 8,674,712
    • Issue date Mar 18, 2014
    • Tokyo Electron Limited
    • Tsuyoshi Aruga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Mounting device
    • Patent number 8,113,084
    • Issue date Feb 14, 2012
    • Tokyo Electron Limited
    • Kazuya Yano
    • Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Information Patent Grant

    Mounting device
    • Patent number 7,963,513
    • Issue date Jun 21, 2011
    • Tokyo Electron Limited
    • Hiroshi Shimoyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe apparatus and method for measuring electrical characteristics...
    • Patent number 7,940,065
    • Issue date May 10, 2011
    • Tokyo Electron Limited
    • Kazuya Yano
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents