Hiroshi Shimoyama

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Nagoya-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring surface charge distribution
- Patent number 8,847,158
- Issue date Sep 30, 2014
- Ricoh Company, Ltd.
- Hiroyuki Suhara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electron gun minimizing sublimation of electron source and electron...
- Patent number 8,330,344
- Issue date Dec 11, 2012
- Advantest Corp.
- Hiroshi Yasuda
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR MEASURING SURFACE CHARGE DISTRIBUTION
- Publication number 20120059612
- Publication date Mar 8, 2012
- Hiroyuki SUHARA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Electron gun and electron beam exposure apparatus
- Publication number 20100019648
- Publication date Jan 28, 2010
- Hiroshi Yasuda
- B82 - NANO-TECHNOLOGY