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QUALITY EVALUATION METHOD
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Publication date Sep 23, 2021
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Sumitomo Electric Industries, Ltd.
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G01 - MEASURING TESTING
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FINE PARTICLE MEASUREMENT DEVICE
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Publication date Jan 7, 2021
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Sumitomo Electric Industries, Ltd.
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G01 - MEASURING TESTING
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MICROSCOPE DEVICE
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Publication number 20180073925
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Publication date Mar 15, 2018
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Sumitomo Electric Industries, Ltd.
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Hiroshi Suganuma
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G02 - OPTICS
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MICROSCOPE
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Publication number 20170146786
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Publication date May 25, 2017
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Sumitomo Electric Industries, Ltd.
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Takuya Okuno
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G02 - OPTICS
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MICROSCOPE SYSTEM FOR SURGERY
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Publication number 20160091707
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Publication date Mar 31, 2016
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Sumitomo Electric Industries, Ltd.
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Takuya OKUNO
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G02 - OPTICS
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FOREIGN MATTER DETECTION DEVICE
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Publication number 20110216190
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Publication date Sep 8, 2011
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Sumitomo Electric Industries, Ltd.
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Takayuki Shimazu
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B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
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IMAGING APPARATUS
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Publication number 20110141315
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Publication date Jun 16, 2011
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Sumitomo Electric Industries, Ltd.
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Eiichiro YAMADA
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H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Semiconductor laser device
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Publication number 20060029114
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Publication date Feb 9, 2006
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SUMITOMO ELECTRIC INDUSTRIES, LTD.
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Hiroshi Kohda
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H01 - BASIC ELECTRIC ELEMENTS
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Optical signal processor
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Publication number 20030228108
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Publication date Dec 11, 2003
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SUMITOMO ELECTRIC INDUSTRIES, LTD.
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Michiko Takushima
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G02 - OPTICS
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Optical signal processing apparatus
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Publication number 20030197935
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Publication date Oct 23, 2003
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SUMITOMO ELECTRIC INDUSTRIES, LTD.
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Michiko Takushima
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H04 - ELECTRIC COMMUNICATION TECHNIQUE