Hiroshi Takahashi

Follow

Person

Ehime, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Fault test apparatus and method for testing semiconductor device un...
- Patent number 7,983,858
- Issue date Jul 19, 2011
- Semiconductor Technology Academic Research Center
- Yuzo Takamatsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Fault test apparatus and method for testing semiconductor device un...
- Publication number 20090063062
- Publication date Mar 5, 2009
- Yuzo Takamatsu
- G01 - MEASURING TESTING