Hiroshi Takashima

Person

  • Ibaraki, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Perovskite phosphor film

    • Patent number 8,288,022
    • Issue date Oct 16, 2012
    • National Institute of Advanced Industrial Science and Technology
    • Keiichi Ikegami
    • C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
  • Information Patent Grant

    Perovskite oxide thin film EL element

    • Patent number 8,193,704
    • Issue date Jun 5, 2012
    • National Institute of Advanced Industrial Science and Technology
    • Hiroshi Takashima
    • C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
  • Information Patent Grant

    Capacitance temperature sensor and temperature measuring device

    • Patent number 7,134,785
    • Issue date Nov 14, 2006
    • National Institute of Advanced Industrial Science and Technology
    • Hiroshi Takashima
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    OXIDE SEMICONDUCTOR

    • Publication number 20180305219
    • Publication date Oct 25, 2018
    • NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
    • Naoto Kikuchi
    • C01 - INORGANIC CHEMISTRY
  • Information Patent Application

    PEROVSKITE PHOSPHOR FILM

    • Publication number 20110143144
    • Publication date Jun 16, 2011
    • NATIONAL INSTUTITUE OF ADVANCED INDUSTRIAL SCEINCE AND TECHNOLOGY
    • Keiichi Ikegami
    • C30 - CRYSTAL GROWTH
  • Information Patent Application

    PEROVSKITE OXIDE THIN FILM EL ELEMENT

    • Publication number 20110121722
    • Publication date May 26, 2011
    • NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
    • Hiroshi Takashima
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    Capacitance temperature sensor and temperature measuring device

    • Publication number 20050238081
    • Publication date Oct 27, 2005
    • NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
    • Hiroshi Takashima
    • G01 - MEASURING TESTING