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Hiroshi Takekawa
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Kunitachi, JP
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last 30 patents
Information
Patent Grant
Method for effecting heterogeneous immunological analysis
Patent number
5,175,086
Issue date
Dec 29, 1992
Olympus Optical Co., Ltd.
Hiroshi Takekawa
G01 - MEASURING TESTING
Information
Patent Grant
Agglutination analyzing vessel
Patent number
5,017,341
Issue date
May 21, 1991
Olympus Optical Co., Ltd.
Hiroshi Takekawa
G01 - MEASURING TESTING
Information
Patent Grant
Carrier transporting apparatus and carrier container for use in an...
Patent number
4,937,048
Issue date
Jun 26, 1990
Olympus Optical Company Limited
Masahiko Sakai
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Liquid distributing device for use in chemical analyzer
Patent number
4,591,568
Issue date
May 27, 1986
Olympus Optical Co., Ltd.
Taiichi Banno
G01 - MEASURING TESTING
Information
Patent Grant
Photometering apparatus for use in chemical analyzer
Patent number
4,498,780
Issue date
Feb 12, 1985
Olympus Optical Co., Ltd.
Taiichi Banno
G01 - MEASURING TESTING
Information
Patent Grant
Method of automatically analyzing chemical substances and an automa...
Patent number
4,483,927
Issue date
Nov 20, 1984
Olympus Optical Co., Ltd.
Hiroshi Takekawa
G01 - MEASURING TESTING
Information
Patent Grant
Automated apparatus for photometrically detecting immunological agg...
Patent number
4,457,893
Issue date
Jul 3, 1984
Olympus Optical Co. Ltd.
Hiroshi Takekawa
G01 - MEASURING TESTING
Information
Patent Grant
Immunological agglutination pattern detection device
Patent number
4,452,759
Issue date
Jun 5, 1984
Olympus Optical Company Limited
Hiroshi Takekawa
G01 - MEASURING TESTING
Information
Patent Grant
Liquid distributing device for use in chemical analyzer
Patent number
4,448,752
Issue date
May 15, 1984
Olympus Optical Co., Ltd.
Taiichi Banno
G01 - MEASURING TESTING
Information
Patent Grant
Method of measuring agglutinating reaction and a reaction vessel th...
Patent number
4,373,931
Issue date
Feb 15, 1983
Olympus Optical Company Limited
Hiroshi Takekawa
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Method for measuring ion activity
Patent number
4,204,917
Issue date
May 27, 1980
Olympus Optical Co., Ltd.
Tadao Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring ion activity
Patent number
4,172,777
Issue date
Oct 30, 1979
Olympus Optical Co., Ltd.
Tadao Yamamoto
G01 - MEASURING TESTING