Hiroshi Takeno

Person

Annaka-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for manufacturing semiconductor device and method for evalua...
- Patent number 10,886,129
- Issue date Jan 5, 2021
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi Ohtsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing silicon wafer
- Patent number 10,297,463
- Issue date May 21, 2019
- Shin-Etsu Handotai Co., Ltd.
- Katsuyoshi Suzuki
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for evaluating semiconductor substrate
- Patent number 9,748,151
- Issue date Aug 29, 2017
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi Ohtsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring recombination lifetime of silicon substrate
- Patent number 9,530,702
- Issue date Dec 27, 2016
- Shin-Etsu Handotai Co., Ltd.
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon epitaxial wafer and method for manufacturing the same
- Patent number 8,729,676
- Issue date May 20, 2014
- Shin-Etsu Handotai Co., Ltd.
- Yutaka Shiga
- C30 - CRYSTAL GROWTH
Information Patent Grant
SOI (silicon on insulator) structure semiconductor device and metho...
- Patent number 8,410,573
- Issue date Apr 2, 2013
- Denso Corporation
- Hiroshi Ohtsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing SOI substrate
- Patent number 8,338,277
- Issue date Dec 25, 2012
- Shin-Etsu Handotai Co., Ltd.
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing SOI wafer
- Patent number 8,268,705
- Issue date Sep 18, 2012
- Shin-Etsu Handotai Co., Ltd.
- Kazuhiko Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing soi wafer
- Patent number 7,985,660
- Issue date Jul 26, 2011
- Shin-Etsu Handotai Co., Ltd.
- Isao Yokokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing SOI wafer
- Patent number 7,910,455
- Issue date Mar 22, 2011
- Shin-Etsu Handotai Co., Ltd.
- Kazuhiko Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing SOI wafer and thus-manufactured SOI wafer
- Patent number 7,902,042
- Issue date Mar 8, 2011
- Shin-Etsu Handotai Co., Ltd.
- Hiroji Aga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing SOI substrate
- Patent number 7,799,660
- Issue date Sep 21, 2010
- Shin-Etsu Handotai Co., Ltd.
- Tohru Ishizuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing SOI substrate and SOI substrate
- Patent number 7,749,861
- Issue date Jul 6, 2010
- Shin-Etsu Handotai Co., Ltd.
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Annealed wafer and method for manufacturing the same
- Patent number 7,311,888
- Issue date Dec 25, 2007
- Shin-Etsu Handotai Co., Ltd.
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon epitaxial wafer and process for manufacturing the same
- Patent number 7,229,501
- Issue date Jun 12, 2007
- Shin-Etsu Handotai Co., Ltd.
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing annealed wafer and annealed wafer
- Patent number 7,189,293
- Issue date Mar 13, 2007
- Shin-Etsu Handotai Co., Ltd.
- Norihiro Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for manufacturing silicon wafer and silicone epitaxial wafe...
- Patent number 7,033,962
- Issue date Apr 25, 2006
- Shin-Etsu Handotai Co., Ltd.
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon wafer and silicon epitaxial wafer and production methods th...
- Patent number 6,858,094
- Issue date Feb 22, 2005
- Shin-Etsu Handotai Co., Ltd.
- Wei Feig Qu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing silicon single crystal, silicon single cry...
- Patent number 6,544,332
- Issue date Apr 8, 2003
- Shin-Etsu Handotai Co., Ltd.
- Makoto Iida
- C30 - CRYSTAL GROWTH
Information Patent Grant
Process for manufacturing silicon epitaxial wafer
- Patent number 6,544,899
- Issue date Apr 8, 2003
- Shin-Etsu Handotai Co.
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon wafer and production method thereof and evaluation method f...
- Patent number 6,544,490
- Issue date Apr 8, 2003
- Shin-Etsu Handotai Co., Ltd.
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon single crystal wafer, epitaxial silicon wafer, and methods...
- Patent number 6,478,883
- Issue date Nov 12, 2002
- Shin-Etsu Handotai Co., Ltd.
- Masaro Tamatsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Production method for silicon epitaxial wafer
- Patent number 6,277,715
- Issue date Aug 21, 2001
- Shin-Etsu Handotai Co., Ltd.
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for heat treatment of silicon substrate, substrate treated b...
- Patent number 6,264,906
- Issue date Jul 24, 2001
- Shin-Etsu Handotai Co., Ltd.
- Ken Aihara
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method of determining oxygen precipitation behavior in a silicon mo...
- Patent number 6,206,961
- Issue date Mar 27, 2001
- Shin-Etsu Handotai Co., Ltd.
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for heat treatment of silicon substrate, substrate treated b...
- Patent number 6,143,071
- Issue date Nov 7, 2000
- Shin-Etsu Handotai Co., Ltd.
- Ken Aihara
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method of evaluating a silicon single crystal
- Patent number 5,598,452
- Issue date Jan 28, 1997
- Shin-Etsu Handotai Co., Ltd.
- Hiroshi Takeno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR PRODUCING SEMICONDUCTOR APPARATUS FOR QUANTUM COMPUTER
- Publication number 20230276716
- Publication date Aug 31, 2023
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi OHTSUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PRODUCING SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR APPA...
- Publication number 20230230926
- Publication date Jul 20, 2023
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi OHTSUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND METHOD FOR EVALUA...
- Publication number 20190267239
- Publication date Aug 29, 2019
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi OHTSUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SILICON WAFER
- Publication number 20180247830
- Publication date Aug 30, 2018
- Shin-Etsu Handotai Co., Ltd.
- Katsuyoshi SUZUKI
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR EVALUATING SEMICONDUCTOR SUBSTRATE
- Publication number 20160365293
- Publication date Dec 15, 2016
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi OHTSUKI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR SUBSTRATE FOR FLASH LAMP ANNEAL, ANNEAL SUBSTRATE, SE...
- Publication number 20160351415
- Publication date Dec 1, 2016
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi OHTSUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MEASURING RECOMBINATION LIFETIME OF SILICON SUBSTRATE
- Publication number 20160005664
- Publication date Jan 7, 2016
- Shin-Etsu Handotai Co., Ltd.
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON EPITAXIAL WAFER AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20130037920
- Publication date Feb 14, 2013
- Shin-Etsu Handotai Co., Ltd.
- Yutaka Shiga
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR MANUFACTURING SOI SUBSTRATE
- Publication number 20100323502
- Publication date Dec 23, 2010
- Shin-Etsu Handotai Co., Ltd.
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOI (SILICON ON INSULATOR) STRUCTURE SEMICONDUCTOR DEVICE AND METHO...
- Publication number 20100264510
- Publication date Oct 21, 2010
- Denso Corporation
- Hiroshi Ohtsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SOI WAFER
- Publication number 20100112781
- Publication date May 6, 2010
- Shin-Etsu Handotai Co., Ltd.
- Isao Yokokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Producing Soi Wafer
- Publication number 20090280620
- Publication date Nov 12, 2009
- Shin-Etsu Handotai Co., Ltd.
- Kazuhiko Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Producing Soi Wafer
- Publication number 20090104752
- Publication date Apr 23, 2009
- Kazuhiko Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Manufacturing SOI Substrate and SOI Substrate
- Publication number 20090042361
- Publication date Feb 12, 2009
- Shin-Etsu Handotai Co., Ltd.
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing SOI substrate
- Publication number 20080261411
- Publication date Oct 23, 2008
- Shin-Etsu Handotai Co., Ltd.
- Tohru Ishizuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method Of Manufacturing Soi Wafer And Thus-Manufactured Soi Wafer
- Publication number 20080128851
- Publication date Jun 5, 2008
- Shin-Etsu Handotai Co., Ltd.
- Hiroji Aga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for manufacturing silicon wafer and silicon epitaxial wafer...
- Publication number 20060130736
- Publication date Jun 22, 2006
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Annealed wafer and anneald wafer manufacturing method
- Publication number 20060075957
- Publication date Apr 13, 2006
- Hiroshi Takeno
- C30 - CRYSTAL GROWTH
Information Patent Application
Silicon epitaxial wafer and its production method
- Publication number 20050087830
- Publication date Apr 28, 2005
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Production method for anneal wafer and anneal wafer
- Publication number 20040231759
- Publication date Nov 25, 2004
- Norihiro Kobayashi
- C30 - CRYSTAL GROWTH
Information Patent Application
Silicon wafer manufacturing method, silicon epitaxial wafer manufac...
- Publication number 20040171234
- Publication date Sep 2, 2004
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Silicon wafer and silicon epitaxial wafer and producition methods t...
- Publication number 20040005777
- Publication date Jan 8, 2004
- Wei Freig Qu
- C30 - CRYSTAL GROWTH
Information Patent Application
PROCESS FOR MANUFACTURING SILICON EPITAXIAL WAFER
- Publication number 20030008480
- Publication date Jan 9, 2003
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for producing silicon epitaxial wafer
- Publication number 20020157597
- Publication date Oct 31, 2002
- Hiroshi Takeno
- H01 - BASIC ELECTRIC ELEMENTS

Hiroshi Takeno

Person

Patents Grantslast 30 patents

Method for manufacturing semiconductor device and method for evalua...

Method for manufacturing silicon wafer

Method for evaluating semiconductor substrate

Method for measuring recombination lifetime of silicon substrate

Silicon epitaxial wafer and method for manufacturing the same

SOI (silicon on insulator) structure semiconductor device and metho...

Method for manufacturing SOI substrate

Method for producing SOI wafer

Method for manufacturing soi wafer

Method for producing SOI wafer

Method of manufacturing SOI wafer and thus-manufactured SOI wafer

Method for manufacturing SOI substrate

Method for manufacturing SOI substrate and SOI substrate

Annealed wafer and method for manufacturing the same

Silicon epitaxial wafer and process for manufacturing the same

Method of producing annealed wafer and annealed wafer

Methods for manufacturing silicon wafer and silicone epitaxial wafe...

Silicon wafer and silicon epitaxial wafer and production methods th...

Method for manufacturing silicon single crystal, silicon single cry...

Process for manufacturing silicon epitaxial wafer

Silicon wafer and production method thereof and evaluation method f...

Silicon single crystal wafer, epitaxial silicon wafer, and methods...

Production method for silicon epitaxial wafer

Method for heat treatment of silicon substrate, substrate treated b...

Method of determining oxygen precipitation behavior in a silicon mo...

Method for heat treatment of silicon substrate, substrate treated b...

Method of evaluating a silicon single crystal

Patents Applicationslast 30 patents

METHOD FOR PRODUCING SEMICONDUCTOR APPARATUS FOR QUANTUM COMPUTER

METHOD FOR PRODUCING SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR APPA...

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND METHOD FOR EVALUA...

METHOD FOR MANUFACTURING SILICON WAFER

METHOD FOR EVALUATING SEMICONDUCTOR SUBSTRATE

SEMICONDUCTOR SUBSTRATE FOR FLASH LAMP ANNEAL, ANNEAL SUBSTRATE, SE...

METHOD FOR MEASURING RECOMBINATION LIFETIME OF SILICON SUBSTRATE

SILICON EPITAXIAL WAFER AND METHOD FOR MANUFACTURING THE SAME

METHOD FOR MANUFACTURING SOI SUBSTRATE

SOI (SILICON ON INSULATOR) STRUCTURE SEMICONDUCTOR DEVICE AND METHO...

METHOD FOR MANUFACTURING SOI WAFER

Method for Producing Soi Wafer

Method for Producing Soi Wafer

Method for Manufacturing SOI Substrate and SOI Substrate

Method for manufacturing SOI substrate

Method Of Manufacturing Soi Wafer And Thus-Manufactured Soi Wafer

Methods for manufacturing silicon wafer and silicon epitaxial wafer...

Annealed wafer and anneald wafer manufacturing method

Silicon epitaxial wafer and its production method

Production method for anneal wafer and anneal wafer

Silicon wafer manufacturing method, silicon epitaxial wafer manufac...

Silicon wafer and silicon epitaxial wafer and producition methods t...

PROCESS FOR MANUFACTURING SILICON EPITAXIAL WAFER

Method for producing silicon epitaxial wafer