Hiroshi Tasaki

Person

Kyoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Monitoring device, method and computer-readable recording medium fo...
- Patent number 10,839,043
- Issue date Nov 17, 2020
- Omron Corporation
- Hiroshi Tasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring device, method and computer-readable recording medium fo...
- Patent number 10,678,887
- Issue date Jun 9, 2020
- Omron Corporation
- Hiroshi Tasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring system and monitoring method
- Patent number 10,521,193
- Issue date Dec 31, 2019
- Omron Corporation
- Hiroshi Tasaki
- G05 - CONTROLLING REGULATING
Information Patent Grant
Feature parameter candidate generation apparatus and feature parame...
- Patent number 8,630,823
- Issue date Jan 14, 2014
- Omron Corporation
- Mitsuhiro Yoneda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection standard setting device, inspection standard setting met...
- Patent number 8,224,605
- Issue date Jul 17, 2012
- Omron Corporation
- Hiroshi Tasaki
- G05 - CONTROLLING REGULATING
Information Patent Grant
Inspection apparatus
- Patent number 7,860,620
- Issue date Dec 28, 2010
- Omron Corporation
- Kazuto Kojitani
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND C...
- Publication number 20240427344
- Publication date Dec 26, 2024
- Omron Corporation
- Yuki HIROHASHI
- G05 - CONTROLLING REGULATING
Information Patent Application
MONITORING DEVICE, METHOD AND COMPUTER-READABLE RECORDING MEDIUM FO...
- Publication number 20180232339
- Publication date Aug 16, 2018
- Omron Corporation
- Hiroshi TASAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SENSOR DEVICE
- Publication number 20180231427
- Publication date Aug 16, 2018
- Omron Corporation
- Hiroshi TASAKI
- G01 - MEASURING TESTING
Information Patent Application
MONITORING DEVICE, METHOD AND COMPUTER-READABLE RECORDING MEDIUM FO...
- Publication number 20180232338
- Publication date Aug 16, 2018
- Omron Corporation
- Hiroshi TASAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MONITORING SYSTEM AND MONITORING METHOD
- Publication number 20160342392
- Publication date Nov 24, 2016
- Omron Corporation
- Hiroshi TASAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUITABILITY DETERMINATION METHOD FOR DETERMINATION STANDARD VALUE A...
- Publication number 20120185221
- Publication date Jul 19, 2012
- Omron Corporation
- Hiroyuki Mori
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
FEATURE PARAMETER CANDIDATE GENERATION APPARATUS AND FEATURE PARAME...
- Publication number 20100235151
- Publication date Sep 16, 2010
- Mitsuhiro Yoneda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FACTOR ESTIMATING SUPPORT DEVICE AND METHOD OF CONTROLLING THE SAME...
- Publication number 20080219544
- Publication date Sep 11, 2008
- Omron Corporation
- Hiroshi Tasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection apparatus
- Publication number 20070265743
- Publication date Nov 15, 2007
- Omron Corporation
- Kazuto Kojitani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection standard setting device, inspection standard setting met...
- Publication number 20060271226
- Publication date Nov 30, 2006
- Omron Corporation
- Hiroshi Tasaki
- G05 - CONTROLLING REGULATING
Information Patent Application
Inspection method and inspection apparatus
- Publication number 20060210141
- Publication date Sep 21, 2006
- Omron Corporation
- Kazuto Kojitani
- G06 - COMPUTING CALCULATING COUNTING

Hiroshi Tasaki

Person

Patents Grantslast 30 patents

Monitoring device, method and computer-readable recording medium fo...

Monitoring device, method and computer-readable recording medium fo...

Monitoring system and monitoring method

Feature parameter candidate generation apparatus and feature parame...

Inspection standard setting device, inspection standard setting met...

Inspection apparatus

Patents Applicationslast 30 patents

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND C...

MONITORING DEVICE, METHOD AND COMPUTER-READABLE RECORDING MEDIUM FO...

SENSOR DEVICE

MONITORING DEVICE, METHOD AND COMPUTER-READABLE RECORDING MEDIUM FO...

MONITORING SYSTEM AND MONITORING METHOD

SUITABILITY DETERMINATION METHOD FOR DETERMINATION STANDARD VALUE A...

FEATURE PARAMETER CANDIDATE GENERATION APPARATUS AND FEATURE PARAME...

FACTOR ESTIMATING SUPPORT DEVICE AND METHOD OF CONTROLLING THE SAME...

Inspection apparatus

Inspection standard setting device, inspection standard setting met...

Inspection method and inspection apparatus