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Hiroshi Tokunaga
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Yokohama, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Stress detection method for force sensor device with multiple axis...
Patent number
7,472,611
Issue date
Jan 6, 2009
Fujitsu Limited
Toshio Hanazawa
G01 - MEASURING TESTING
Information
Patent Grant
Stress detection method for sensor device with multiple axis sensor...
Patent number
7,320,253
Issue date
Jan 22, 2008
Fujitsu Media Devices Limited
Toshio Hanazawa
G01 - MEASURING TESTING
Information
Patent Grant
Inertial sensor
Patent number
7,069,789
Issue date
Jul 4, 2006
Fujitsu Media Devices Limited
Hiroshi Tokunaga
G01 - MEASURING TESTING
Information
Patent Grant
Inertial sensor
Patent number
7,019,231
Issue date
Mar 28, 2006
Fujitsu Media Devices Limited
Hiroshi Ishikawa
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method for fabricating a micro machine
Patent number
6,946,398
Issue date
Sep 20, 2005
Fujitsu Limited
Shoji Okuda
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Patterning process using ladder-type organosiloxane resin and proce...
Patent number
4,600,685
Issue date
Jul 15, 1986
Fujitsu Limited
Toshisuke Kitakohji
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method for producing MOS semiconductor device
Patent number
4,349,395
Issue date
Sep 14, 1982
Fujitsu Limited
Nobuo Toyokura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
MIS Device having a metal and insulating layer containing at least...
Patent number
4,270,136
Issue date
May 26, 1981
Fujitsu Limited
Nobuo Toyokura
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Stress detection method for force sensor device with multiple axis...
Publication number
20080173106
Publication date
Jul 24, 2008
FUJITSU MEDIA DEVICES LIMITED
Toshio Hanazawa
G01 - MEASURING TESTING
Information
Patent Application
Inertial sensor
Publication number
20060005629
Publication date
Jan 12, 2006
FUJITSU MEDIA DEVICES LIMITED
Hiroshi Tokunaga
G01 - MEASURING TESTING
Information
Patent Application
Stress detection method for force sensor device with multiple axis...
Publication number
20050229720
Publication date
Oct 20, 2005
Toshio Hanazawa
G01 - MEASURING TESTING
Information
Patent Application
Inertial sensor
Publication number
20050217373
Publication date
Oct 6, 2005
Hiroshi Ishikawa
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Inertial sensor
Publication number
20050217378
Publication date
Oct 6, 2005
FUJITSU MEDIA DEVICES LIMITED and FUJITSU LIMITED
Hiroshi Ishikawa
G01 - MEASURING TESTING
Information
Patent Application
Method for fabricating a micro machine
Publication number
20040053507
Publication date
Mar 18, 2004
FUJITSU LIMITED
Shoji Okuda
B81 - MICRO-STRUCTURAL TECHNOLOGY